The laboratory has an array of sophisticated state-of-the art research facilities to accommodate cutting edge materials research.
Stony Brook Synchrotron Topography Station, Beamline X19C, National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY
Bede D1 High Resolution X-ray Diffractometer
- Facility for characterizing single crystal materials by synchrotron white beam x-ray topography (SWBXT).
- Equipped with computer-controlled Huber 5-circle diffractometer. A scanning stage is also available for imaging large crystals.
Versatile high resolution X-ray diffractometer for the characterization of advanced materials. Measurement of important materials properties of epitaxial films, polycrystalline films/powders, bare substrates and porous films using High Resolution double and triple axis X-ray Diffraction, X-ray Diffraction and X-ray Reflectivity. A range of parameters can be measured including thickness, composition, relaxation, strain, area uniformity, density, roughness, phase, crystalline texture, crystallinity, pore size and grain size.
Veeco Dimension 3100 Scanning Probe Microscope
Utilizes standard and advanced SPM imaging modes to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter.
Photographic and Darkroom Equipment
- Nikon Multiphot photomacroscopy system for large format photography
- Enlargers for monochromatic printing
- Fully equipped darkroom for developing negatives and prints