Welcome to the Laboratory for Synchrotron X-Ray Topography at the Department of Material Science, Stony Brook University NY. Our research laboratory is involved with studying advanced materials that are being developed for high technology applications. Materials are characterized primarily by the technique of Synchrotron White Beam X-ray Topography (SWBXT).

Other techniques such as High Resolution X-ray Diffraction, Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are also extensively employed. Materials studied include wide bandgap semiconductors such as silicon carbide, aluminum and gallium nitride, oxides such as sapphire and garnets, silicon for integrated circuits and solar cells, etc.