Synchrotron X-ray Topography Laboratory
Department of Materials Science & Engineering, Stony Brook University, Stony Brook, NY

Introduction

Welcome to the Laboratory for Synchrotron X-Ray Topography at the Department of Material Science, Stony Brook University NY. Our research laboratory is involved with studying advanced materials that are being developed for high technology applications. Materials are characterized primarily by the technique of Synchrotron White Beam X-ray Topography (SWBXT).

Other techniques such as High Resolution X-ray Diffraction, Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are also extensively employed. Materials studied include wide bandgap semiconductors such as silicon carbide, aluminum and gallium nitride, oxides such as sapphire and garnets, silicon for integrated circuits and solar cells, etc.

Research Projects

An Investigation into the Properties of B12As2, B4C and their Heterostructures
National Science Foundation (NSF)

Application of X-Ray Topography to the Study of Defects in Calcium Fluoride, EFG Sapphire and Other Crystals of Interest to St. Gobain
Saint Gobain Crystals

Mapping of package induced in-silicon stresses and assessment of processing-induced edge damage by x-ray topography
Intel Corporation

SWBXT Studies of Grain Size, Orientation and Strain in Polysilicon Crystal Ingots, Bricks and Wafers
BP Solar International Incorporated

UV-radiation assisted chemical vapor deposition of III-nitride functional nanostructures
National Science Foundation (NSF)

A Novel Growth Technique for Large Diameter AIN Single Crystal
Fairfield Crystal Technology LLC (DOE-SBIR)

See all projects