ESM 542    MODERN ELECTRON MICROSCOPY  Spring 2000

Instructor:
Dr. Yimei Zhu, Group Leader 
Electron Microscopy Facility and Nanostructure of Advanced Materials Program
Building 480
Brookhaven National Laboratory  
http://www.bnl.gov/bnlweb/facilities.html
(631)-344-3057
Fax. 344-4071
zhu@bnl.gov

Class Hours:  
    Tuesday and Thursday 
    7:00 to 8:20
    Physics P122.
Examinations:  
    Mid-Term: Thursday, March 12, 7:00 - 8:20pm
    Final: To be announced.

Course Description:
Principles and practice for transmission electron microscopes. Instrument design
and operation. Electron diffraction and imaging theory. Microanalysis using x-ray,
electron spectroscopy and other advanced electron microscope techniques. Typical
EM investigations will be outlined and used as examples.

Course Outline:
The course is organized roughly in the sequence 
of a typical electron microscope study:

Introduction
    Basic concepts
    Elastic & inelastic scattering
Instruments
    Components & electron optics
    Operation, alignment & calibration
    Specimen preparation
Electron diffraction
    Reciprocal space
    Bragg reflection & diffuse scattering
    Convergent-beam diffraction
    Indexing spot pattern & Kikuchi pattern
Kinematical diffraction theory
Dynamic diffraction theory
Electron imaging
    Diffraction contrast: two-beam method
    Characterizing crystal defects (point, line & planar)
    Phase contrast: HREM
    Quantitative HREM & image simulation
X-ray spectroscopy
    Principle & instrumentation
    Quantitative x-ray microanalysis
Electron energy-loss spectroscopy
    Principle & instrumentation
    Quantitative microanalysis
    Energy-filtering & spectroscopy imaging
Lorentz microscopy & magnetic imaging
Electron holography
Scanning transmission electron microscopy

Two TEM demonstration lectures will be included, one using Philips CM12 at
SUNY-SB, the other using JEOL3000F at BNL.

Course Requirements:
    Attendence at Lectures
    Timely completion of homework.
    Mid-Term and Final Exams.
    Background Reading.
    Classroom discussion & questions are encouraged.

Grading:
Letter grades based on homework and exam scores, weighted as follows:
Homework: 25%
Mid-Term: 35%
Final: 40%

Textbook::
D.B. Williams and C.B. Carter
Transmission Electron Microscopy
Plenum (1996).

JQ.