ESM 512 STRUCTURE OF MATERIALS

Fall 1998

INSTRUCTOR: Prof. M. Dudley

Teaching Assistant: Bill Vetter

COURSE CONTENT

Course consists of the following;-

[I.] Lectures (see below).

[II.] Laboratory sequence (see below).

[III.] Short Oral Presentation on Chosen Topic (see below).

[IV.] Homeworks (occasional, as necessary).

[V.] Examinations;- 2 Mid-Terms, 1 Final.

I. Lectures

Material to be Covered:

1. Description of nature and properties of X-rays: Production of X-rays, X-ray sources: Detection of X-rays.

2. Elementary theory of diffraction;- Analysis of directions of diffracted beams - Bragg approach and Von Laue approach.

3. Elementary Crystallography;- Symmetry Elements, Point Groups, Space Groups, Vector Analysis in Non-Orthogonal Systems, Theory of Matrix Transformation Between Lattices.

4. Experimental methods: Powder Technique, Laue method, Use of Diffractometer.

5. Intensities of diffracted beams: Scattering from single electron, atom, unit cell, small crystal - THE KINEMATICAL THEORY OF X-RAY DIFFRACTION.

6. Analysis of assumptions and validity of the kinematical theory - THE DYNAMICAL THEORY OF X-RAY DIFFRACTION.

7. X-ray topography.

II. Laboratory Sequence

Three types of experiment will be covered:

1. Powder Diffraction: Debye-Scherrer, Diffractometer.

2. Diffraction from Polycrystals: Diffractometer.

3. Diffraction from Single Crystals: Orientation analysis.

Students must complete all three types of experiment.

III. Oral Presentation on Chosen Topic

All students must prepare an oral presentation on either a chosen, or assigned (if necessary) subject, recognized by the Instructor as being relevant to X-ray Diffraction. Presentations will occur towards the end of the semester, and will be approximately 20-25 minutes in length (with a few minutes for questions), depending on numbers and availability of time. This section of the course constitutes a unique opportunity for graduate students to practice oratory skills in a competitive environment, which should stand them in good stead for future required presentations such as in the Preliminary Examination, and also for future conference presentations.

ESM 512 Course Evaluation Structure

2 Mid Terms30% (2x15%)Final30%Oral Presentation8%3 Labs. with full write-up24% (3x8%)Homeworks8%

ESM 512: BOOK INFORMATION

Required Texts

Elements of X-ray Crystallography, by L.V. Azaroff, Mc Graw-Hill, 1968, OUT OF PRINT; available as bound xerox copy, Tech Books, 1990.

Recommended Texts

Elements of X-ray Diffraction, by B.D. Cullity, 2nd Edition, Addison-Wesley, 1978.

Diffraction from Materials, by L.H. Schwartz and J.B. Cohen, 1st Edition, out of print (1977), 2nd Edition, Springer-Verlag, 1987.

X-ray Diffraction, by B.E. Warren, Addison-Wesley, 1968, OUT OF PRINT, available as bound xerox copy, University Microfilms International, 1989 or as reprinted version published by Dover, (1990).

Diffraction Physics, by J.M. Cowley, 2nd Revised Edition, North Holland, 1984.

ESM 512 Oral Presentation

The ability to present scientific information orally, in a coherent and lucid manner, and to defend such presentation under the critical examination of one's peers, is recognized as being an important skill. The oral presentation section of the course affords graduate students the opportunity to perfect these skills.

Subject and Content

Choice of subject can be largely left to the discretion of the individual student if so desired. This will encourage inquisitive skills on the part of the student, and potentially leaves room for specialization in an area of particular interest to the student. However, subjects must be in an X-ray Diffraction related area, and must be justified as such. All subjects chosen will be validated as to their relevance by Professor Dudley. Alternatively, a subject may be chosen from a list of suggested titles provided for your perusal.

A 1-2 page, typed precis of the intended content of the Presentation must be handed in before the first Midterm Examination (the date of this will be announced in class).

Suggested Subjects for Oral Presentation

1. Synchrotron X-ray Topography.

2. Total Reflection Bragg Diffraction.

3. Berg-Barrett Topography.

4. Observation of Order-Disorder Transitions by X-ray Diffraction.

5. EXAFS.

6. Small Angle Scattering.

7. Neutron Diffraction.

8. Neutron Topography.

9. Kossel Lines.

10. Multiple Scattering.

11. Monochromatic Synchrotron Radiation Topography.

12. Dislocation Image Contrast on X-ray Topographs.

13. Measurement of Residual Stress.

14. X-ray Interferometry.

15. Use of X-rays to Characterize Solution Grown Crystals.

16. Use of X-rays in the Semiconductor Industry.

17. Weissenberg and Precession Techniques.

18. X-ray Radiography.

19. X-ray Angiography.

20. Anomalous Scattering.

21. Borrmann Topography.

22. Use of X-rays in Study of Thin Films.

23. Wide Angle X-ray Scattering.

24. Dynamical Theory of X-ray Diffraction.

25. Use of X-rays in Phase Diagram Determination.

26. The Physics of a Synchrotron Source.

27. Comparison of X-ray Topography to Electron Microscopy.

28. X-ray Microscopy.

29. Moire Topography.

30. Use of X-rays in Trace Element Analysis.

31. Synchrotron Powder Diffraction.

32. X-ray Fluorescence Analysis.

33. Contrast of Planar Defects on X-ray Topographs.

34. Grazing Bragg-Laue Diffraction.

35. Diffraction from Quasi-Crystals.

36 Triple-axis diffraction.