|
Prof. Michael Dudley, ChairX-ray Topography GroupDept. of Materials Science & Engineering State University of New York at Stony Brook Stony Brook, NY 11794, USA (631) 632-8500. FAX: (631) 632-8052 mdudley@notes.cc.sunysb.edu http://www.matscieng.sunysb.edu/dudley1.html |
|
1. EDUCATION AND CAREER SUMMARY
1975-78 Undergraduate Student, University of Warwick, Coventry, U.K. B.Sc.(Hons) in Materials Science and Physics, 1978 (graduated top of class).
1978-81 Graduate Student, University of Warwick. Ph.D. in Engineering Science, 1982. Thesis Advisor, Prof. D.K. Bowen. Thesis Title: "Deformation Studies on Fe 3.5 wt % Si by X-ray Topography''.
1979-80 Graduate Student Visitor at Prof. A. Authier's Laboratory, Universite de Paris VI, working with Prof. J. Miltat.
1981-84 Postdoctoral Research Assistant, Dept. of Pure & Applied Chemistry, University of Strathclyde, Glasgow, Scotland, working with Prof. J.N. Sherwood.
1984-90 Assistant Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science(CEAS), State University of New York (SUNY) at Stony Brook.
1990-94 Associate Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science(CEAS), State University of New York (SUNY) at Stony Brook.
1993- Chairman, Dept. of Materials Science & Engineering, College of Engineering & Applied Science(CEAS), State University of New York (SUNY) at Stony Brook.
1994- Professor, Dept. of Materials Science & Engineering, College of Engineering & Applied Science (CEAS), State University of New York (SUNY) at Stony Brook.
1984 - Referee for several scientific journals, including: Materials Science & Engineering, Journal of Polymer Science, Materials Letters, Materials Research Society Symposium Proceedings, Journal of Applied Crystallography, Nature, Philosophical Magazine.
1985 - Referee for several funding agencies, including: National Science Foundation, Petroleum Research Fund of the American Chemical Society.
1986 Session Chairman at "Symposium on Solid State Polymerization and the Structure and Properties of Polymers Produced by Lattice Controlled Processes'', ACS Spring Meeting, New York, NY.
1986 - Consultant for various companies, including General Electric, Texas Instruments and SGS-Thomson Microelectronics.
1987 - Director of National Consortium for Synchrotron X-ray Topography, beamline X-19C, at the NSLS, BNL.
1987 - Spokesperson and Contact Person, X-ray Topography Station (beamline X-19C), NSLS, BNL.
1987-92 Faculty Sponsor of The Metallurgical Society (TMS) Student Chapter (The Materials Science Club), SUNY at Stony Brook.
Spring, 1989 Organizer and Chair of joint seminar series entitled "Interfaces Between Materials and Solid Mechanics Research'', coordinated with Department of Mechanical Engineering.
Feb. 1989 Invited lecturer in the "Sundays at Stony Brook'' lecture series (organized by Provost Schubel). Contribution, entitled, "Materials That Changed the World'', organized by Prof. H. Herman, Dept. of Materials Science & Engineering. Lecture title, "Synchrotron Radiation and the Characterization of Materials''.
1990 - X-ray Topography Subgroup Representative on User's Executive Committee at NSLS.
1991 Co-organizer of 1991 NSLS User's Meeting.
1991 Organizer of 1991 NSLS User's Meeting Poster Session.
1993 - Member of Organizing Committee for 5th International Conference on Synchrotron Radiation Instrumentation, to be held at SUNY Stony Brook, July, 1994.
1993 - Member of International Advisory Committee for the International Conference on the Chemistry of the Organic Solid State (ICCOSS).
1993 Appointed chairman of ICCOSS XIII, to be held at Stony Brook, July 1997.
1996 Co-Chairman of Electronic Materials Conference Symposium on Non-Destructive Testing, Santa Barbara, CA, June 26-28, 1996.
1996 Appointed Co-Chairman of "X-TOP U.S." satellite symposium to the "Denver X-ray Conference" to be held in Steamboat Springs, CO in August 1997. 1997 Chairman of ICCOSS XIII, held at Stony Brook, July 13-18, 1997.
1997 Co-Chairman of "X-TOP U.S. '97" satellite symposium to the "Denver
X-ray Conference" held in Steamboat Springs, CO, August 4-8, 1997.
1997 Consultant member of the
International Union of Crystallography, 2001 Chairman of "ONR Workshop on Challenges in Porous and Amorphous Semiconductors", held in Corner Brook, Newfoundland, June 10-14, 2001. 2001 Co-Chair of "Symposium on X-ray Diffraction for Crystal Perfection and Growth" at the "Thirteenth American Conference on Crystal Growth and Epitaxy", held in Burlington, VT, August 12-16, 2001. 2003 Chairman of "ONR Workshop on Extended Defects in Wide Gap Semiconductors" held in Irvington, VA, July 13-17,(2003). 2004 Co-Chair of Materials Research Society Symposium on "SiC: Materials, Processing and Devices", held in San Francisco, CA, April 14-15, (2004). 2005 Chair of "ONR MURI review Meeting on Growth of Wide Bandgap Substrates", held at Stony Brook, April 21-22, (2005).
1984 - Member, Materials Research Society.
1985 - Member, American Chemical Society;
Member, The Metallurgical Society (TMS) of AIME.
1988 - Member, Sigma Xi.
1989 - Member, American Society of Metals;
Member, American Association for the Advancement of Science.
1. Dudley, " Deformation Studies on Fe 3.5 wt % Si by X-ray Topography'', Ph.D. Thesis, University of Warwick, (1982).
2. J. Miltat and M. Dudley, "X-ray Topography'', Chapter 3 in " Applications of Synchrotron Radiation'', C.R.A. Catlow and G.N. Greaves (Editors), Blackie and Son Ltd., Glasgow, U.K., 65-99, (1990).
3. M. Dudley, "Characterization by X-ray Topography'', in Encyclopedia of Advanced Materials, Vol. 4, D. Bloor, R.J. Brook, M.C. Flemings and S. Mahajan (Eds.), Pergamon, 2950-2956, (1994) (Commissioned Review Article).
4. M. Dudley, "Topography, X-ray", Encyclopedia of Applied Physics, G.L. Trigg (Ed.), Wiley-VCH Verlag GmbH, Weinheim, Germany, Vol. 21, pp. 533-547, (1997) (Commissioned Review Article).
5. M. Dudley, Guest Editor, Proceedings of the Thirteenth International Conference on the Chemistry of the Organic Solid State, SUNY at Stony Brook, NY, USA, July 13-18, 1997, Mol. Cryst. Liq. Cryst., 313, 1-372, (1998).
6. M. Dudley and X.R. Huang, "X-ray Characterization of Epitaxial Layers", in "Encyclopedia of Materials: Science and Technology", K.J.H. Buschow, R.W. Cahn, M.C. Flemings, B. Ilschner, E.J. Kramer and S. Mahajan (Eds.), Elsevier Science, New York, (2001).
7. M. Dudley and X.R. Huang, "X-ray Topography", in "Encyclopedia of Materials: Science and Technology", K.J.H. Buschow, R.W. Cahn, M.C. Flemings, B. Ilschner, E.J. Kramer and S. Mahajan (Eds.), Elsevier Science, New York, (2001).
8. M. Dudley and Xianrong Huang, "X-ray Topography", Chapter 7 in "Microprobe Characterisation of Optoelectronic Materials", J. Jimenez (Ed.), part of the series: Optoelectronic Properties of Semiconductors and Superlattices, O. Manasreh (series Ed.), Taylor and Francis, (2003).
9. M. Dudley, X.-R. Huang, and W.M. Vetter, "Synchrotron White Beam X-ray
Topography and High Resolution Diffraction Studies of Defects in SiC
Substrates, Epilayers and Device Structures", in "Silicon Carbide; Recent Major
Advances", W.J. Choyke, H. Matsunami, and G. Pensl (Eds.), Springer-Verlag,
Berlin, Heidelberg, New York, 629-648, (2003).
10. "Silicon Carbide 2004 - Materials, Processing and Devices", Materials
Research Society Symposium Proceedings, Vol. 815, Michael Dudley, Perena Gouma,
Tsunenobu Kimoto, Philip G. Neudeck, and Stephen E. Saddow (Editors), Materials
Research Society, Warrendale, PA (2004).
1. Book:"Advances in Materials Characterization, II", Materials Science Research Vol. 19, Edited by R.L. Snyder, R.A.Condrate, Sr., and P.F. Johnson, Plenum, (1985), Review Appears in Mater. Sci & Engin., 96, 326, (1987).
1. J.Miltat and M. Dudley, "Projective Properties of Laue Topographs'', J. Appl. Cryst., 13, 555-562, (1980).
2. M. Dudley, J.N. Sherwood, D. Bloor and D.J. Ando, "A Comparison of the Dislocation Sub-Structure of PTS Monomer and Polymer'', J. Mater. Sci. Letts., 1, 479-481, (1982).
3.. M. Dudley, J.N. Sherwood, D. Bloor and D.J. Ando,"SRS radiation Induced Polymerization of 2,4-Hexadiynediol-bis-(p-toluene sulphonate) (PTS)'', Mol. Cryst. Liq. Cryst., 93, 223-237, (1983).
4. M. Dudley, J.N. Sherwood, D.J. Ando and D. Bloor,"SRS Radiation Induced Polymerization of Diacetylene Monomers'', in" Application of Synchrotron Radiation to Problems in Materials Science'', D.K. Bowen (Editor), Science and Engineering Research Council, Daresbury Laboratory, DL/SCI/R19, (1983), pp.78-83.
5. M. Dudley, J. Miltat and D.K. Bowen, "A Study of Slip Nucleation in Fe 3.5 wt % Si Single Crystals by Synchrotron Radiation Topography'', Phil. Mag., A50, 487-504, (1984).
6. M. Dudley, J.N. Sherwood, D. Bloor and D.J. Ando,"X-ray Topographic Studies of the Solid State Polymerization of Pts (2,4-HexadiyneDiol Bis( p -Toluene Sulphonate))'', in" Polydiacetylenes'', Nato-ASI Series E, Applied Sciences - No 102, R.R. Chance and D. Bloor (Editors), M. Nijhoff Publishers, Dordrecht, NL, (1985), pp. 87-93.
7. M. Dudley, J.N. Sherwood and D. Bloor, "X-ray Topographic Studies of the Polymerization Process in PTS Single Crystals'', Polymeric Materials: Science & Engineering (Proceedings of ACS Division of), 54, 426-430, (1986).
8. M. Dudley, "Applications of Synchrotron Radiation Topography to Dynamic Processes in Single Crystals'', Nucl. Inst. & Meth., B24/25, 1068-1072, (1987).
9. M. Dudley, "Application of Synchrotron Topography to Solid State Reactions'', in " Chemical Applications of Synchrotron Radiation'', Workshop Report ANL/-APS-TM 4, M. Beno and S. Rice (Editors), Argonne National Laboratory, Argonne, Illinois, (1989), pp. 157-198.
10. M. Dudley, "White Beam Topographic Studies of the Effects of Localized Stress Fields on the Kinetics of Single Crystal Solid State Reactions'', in "Synchrotron Radiation in Materials Research'', J.H. Weaver, R. Clarke and J. Gland (Eds.), Mat. Res. Soc. Symp. Proc., 143, 253-258, (1989).
11. M. Dudley, J. Wu and G.-D. Yao, "Determination of Penetration Depths and Analysis of Strains in Single Crystals by White Beam Synchrotron X-ray Topography in Grazing Bragg-Laue Geometries'', Nucl. Inst. & Meth., B40/41, 388-392, (1989).
12. M. Dudley and J. Miltat, "Synchrotron Topographic Studies of the Influence of Applied Elastic Stress on Magnetic Domain Configurations in Fe 3.5 wt % Si Single Crystals'', Nucl. Inst. & Meth., B40/41, 393-397, (1989).
13. M. Dudley, "The Application of Neutron Topography to the Study of X-ray Sensitive Organic Single Crystals - A Possible Alternative to X-ray Topography'', in "Neutron Scattering for Materials Science'', S. Shapiro, S.C. Moss and J.D. Jorgensen (Eds.), Mat. Res. Soc. Symp. Proc., 166, 55-60, (1990).
14. M. Dudley, J. Wu, G.-D. Yao, H.-Y. Liu and Y.C. Kao,"Determination of 3-Dimensio\-nal Defect Structures in Gallium Arsenide Epilayers on Silicon Using White Beam Synchrotron Radiation Topography in both Transmission and Grazing Bragg-Laue Geometry'', in "Layered Structures, Heteroepitaxy, Superlattices, Strain and Metastability'', B.W. Dodson, L.J. Schowalter, J.E. Cunningham and F.H. Pollak (Eds.), Mat. Res. Soc. Symp. Proc., 160, 469-474, (1990).
15. M. Dudley, G.-D. Yao, J. Wu and H.-Y. Liu, "Depth Sensitive Imaging of Defects in Epilayers and Single Crystals Using White Beam Synchrotron Radiation Topography in Grazing Bragg-Laue Geometry'', in "Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures'', J. Bernholc, E.E. Haller and D.J. Wolford (Eds.), Mat. Res. Soc. Symp. Proc., 163, 1031-1036, (1990).
16. A.P. Jardine, M. Dudley, G.-D. Yao and G. Tolis,"X-ray Topographic Analysis of Strain Fields Associated with Micron-Sized Gratings on Si (100) Surfaces'', in "Layered Structures, Heteroepitaxy, Superlattices, Strain and Metastability'', B.W. Dodson, L.J. Schowalter, J.E. Cunningham and F.H. Pollak (Eds.), Mat. Res. Soc. Symp. Proc., 160, 533-538,(1990).
17. M. Dudley, J. Baruchel and J.N. Sherwood, "Neutron Topography as a Tool for Studying Reactive Organic Crystals: A Feasibility Study'', J. Appl. Cryst., 23, 186-198, (1990).
18. M. Dudley, S.Y. Hou and B.M. Foxman, "Synchrotron White Radiation Topographic Studies of the X-ray Induced Solid State Polymerization of Bis (Propiolato) TetraAqu\-oZinc(II) Single Crystals'', Mol. Cryst. Liq. Cryst., 187, 207-213, (1990).
19. G-D. Yao, M. Dudley and J. Wu, ``Synchrotron White Beam Topographic Imaging in Grazing Bragg-Laue Geometries'', J. X-ray Science & Technology, 2, 195-213, (1990).
20. M. Dudley, G. Tolis, D. Gordon-Smith and C. Fazi,"Synchrotron X-ray Topographic Investigation of Electromagnetic Breakdown Induced in p-n Junctions on Silicon'', Government Microcircuit Applications Conference Digest of Papers, Vol. XVI, 651-654, (1990), (Restricted Distribution).
21. M. Dudley, F.F.Y. Wang, T. Fanning, G. Tolis, J. Wu, and D.T. Hodul, "Synchrotron X-ray Topographic Studies of the Changes in Defect Microstructure Induced by Rapid Thermal Processing of Silicon'',Mater. Letts., 10, 87-92, (1990).
22. Y. Wang, X. Liu, G.-D. Yao, R.C. Liebermann and M. Dudley, "High Temperature TEM and X-ray Diffraction Studies on Twinning and the Phase Transition at 145_C in LaGaO3'',Mater. Sci. & Engin., A132, 13-21, (1991).
23. G-D. Yao, M. Dudley, Y. Wang, X. Liu and R.C. Liebermann, "Synchrotron X-ray Topographic Studies of Twinning and the Phase Transition at 145_C in LaGaO3 Single Crystals'', Mater. Sci. & Engin., A132, 23-30, (1991).
24. G.-D. Yao, M. Dudley, S.-Y. Hou and R. DiSalvo, "Application of White Beam Synchrotron Radiation Topography to the Analysis of Twins'', Nucl. Instr. & Meth., B56/57, 400-404, (1991).
25. G.-D. Yao, M. Dudley, Y. Wang, X. Liu and R.C. Liebermann, "Synchrotron Radiation Topography Studies of the Phase Transition in LaGaO3 Single Crystals'', Nucl. Instr. & Meth., B56/57, 405-409, (1991).
26. M. Dudley, F.F.Y. Wang, T. Fanning, G. Tolis and J. Wu, "Synchrotron Topographic Studies of the Influence of Rapid Thermal Annealing on Defect Structures in Single Crystal Silicon'', in "Defects in Materials'', P.D. Bristowe, J.E. Epperson, J.E. Griffith and Z. Liliental-Weber (Eds.), Mat. Res. Soc. Symp. Proc., 209, 511-516, (1991).
27. G.-D. Yao, J. Wu, M. Dudley, V. Shastry and P. Anderson, "Influence of Surface Relaxation on X-ray Topographic Imaging of Interfacial Dislocations in Heterosystems'', in "Defects in Materials'', P.D. Bristowe, J.E. Epperson, J.E. Griffith and Z. Liliental-Weber (Eds.), Mat. Res. Soc. Symp. Proc., 209,707-712, (1991).
28. M. Dudley, G.-D. Yao, D. Paine, D. Howard and R.N. Sacks, "Combined TEM and X-ray Topographic Characterization of InxGa1-xAs Strained Layer Systems'', in "Defects in Materials'', P.D. Bristowe, J.E. Epperson, J.E. Griffith and Z. Liliental-Weber (Eds.), Mat. Res. Soc. Symp. Proc., 209, 655-660, (1991).
29. M. Dudley, J.N. Sherwood and D. Bloor,"X-ray Topographic Studies of Solid State Reactions. 2. Solid State Polymerization of 2,4-HexadiyneDiol-Bis-( p-Toluene Sulphonate) [PTS], Proc. R. Soc. Lond., A434, 243-261, (1991).
30. M. Dudley, F.F.Y. Wang, T. Fanning and D. Gordon-Smith, "Synchrotron X-ray Topography as a Non-Destructive Testing (NDT) Monitor of I.C. Processing'', in "Rapid Thermal and Integrated Processing'', M.L. Green, J.C. Gelpey, J. Wortman, and R. Singh (Eds.), Mat. Res. Soc. Symp. Proc., 224, 61-66, (1991).
31. T. Fanning, M. Dudley, F.F.Y. Wang, D. Gordon-Smith and D.T. Hodul, "Synchrotron X-ray Topographic Study of Defects in High Carbon-Containing Si Wafers'', in "Materials Reliability Issues in Microelectronics'', J.R. Lloyd, T.S. Ho, C.T. Sah, and E. Yost (Eds.), Mat. Res. Soc. Symp. Proc., 225, 301-306, (1991).
32. M.Dudley, G.-D. Yao, D. Paine, D. Howard and R.N. Sacks, "A Characterization of InxGa1-xAs Strained Layer Systems Using a Combination of Synchrotron X-Ray Topography and TEM'', Mater. Sci. & Engin. B10, 75-84, (1991).
33. M. Dudley, R. DiSalvo, S.-Y. Hou, B.M. Foxman, and W. Jones, "Characterization of Defects in p-terphenyl Single Crystals'', Mol. Cryst. Liq. Cryst., 211, 35-42, (1992).
34. M. Dudley, R. DiSalvo, Jun Wu, D. Gordon-Smith and W. Jones, "Synchrotron Topography Observations of a Low Temperature Phase Transition in an Organic Single Crystal'', Mol. Cryst. Liq. Cryst., 211, 43-49, (1992).
35. D. Yuan and M. Dudley, "Dislocation Line Direction Determination in Pyrene Single Crystals'', Mol. Cryst. Liq. Cryst., 211, 51-58, (1992).
36. G.-D. Yao, S.-Y. Hou, M. Dudley, and J.M. Phillips, "Synchrotron X-ray Topography Studies of Twin Configurations in Lanthanum Aluminate Single Crystals'', J. Mater. Res., 7, 1847-1855, (1992).
37. F. Liu, I. Baker, G.-D. Yao and M. Dudley, "Dislocations and Grain Boundaries in Polycrystalline Ice: A Preliminary Study by Synchrotron X-ray Topography'', J. Mater. Sci., 27, 2719-2725, (1992).
38. F. Liu, I. Baker, G.-D. Yao and M. Dudley, " Dynamic Observation of Dislocation Sources at Grain Boundaries in Ice'', Phil. Mag. Lett., 65, 279-281, (1992).
39. F. Liu, I. Baker, M. Dudley, and G.-D. Yao, "Synchrotron X-ray Topography of Polycrystalline Ice'', Proceedings of IAHR Ice Symposium 1992, Banff, Alberta, Canada, 1115-1126, (1992).
40. M. Dudley, G.-D. Yao and J. Wu, "Investigation of Semiconductor Heterostructures by Synchrotron White Beam X-ray Topography in Grazing Bragg-Laue Geometries'', Advances in X-ray Analysis, 35, 247-254, (1992).
41. G.-D. Yao, S.-Y. Hou, M. Dudley, and J.M. Phillips, "Characterization of Superconductor Heterostructures Using Synchrotron X-ray Topography'', Advances in X-ray Analysis, 35, 255-263,(1992).
42. D. DiMarzio, L.G. Casagrande, M.B. Lee, T. Fanning, and M. Dudley, "Rapid Structural Defect Mapping of Bulk II-VI Semiconductors Using White Beam Synchrotron Topography and X-ray Rocking Curve Analysis'', in "Defect Engineering in Semiconductor Growth, Processing and Device Technology'', S. Ashok, J. Chevallier, K. Sumino, and E. Weber (Eds.), Mat. Res. Soc. Symp. Proc., 262, 169-174, (1992).
43. M.B. Lee, T. Fanning, D. DiMarzio, L.G. Casagrande, and M. Dudley, "Optimization of MBE Growth of CdTe/CdTe: Refinement in Structural Quality Evaluation of MBE Grown (111) CdTe'', in "Defect Engineering in Semiconductor Growth, Processing and Device Technology'', S. Ashok, J. Chevallier, K. Sumino, and E. Weber (Eds.), Mat. Res. Soc. Symp. Proc., 262, 215-220, (1992).
44. M. Dudley, J. Wu, V. Shastry, and P. Anderson, "Influence of Surface Relaxation and Multidislocation Strain Field Interactions on X-ray Topographic Images of Dislocations in Semiconductor Materials'', in "Defect Engineering in Semiconductor Growth, Processing and Device Technology'', S. Ashok, J. Chevallier, K. Sumino, and E. Weber (Eds.), Mat. Res. Soc. Symp. Proc., 262, 265-270, (1992).
45. M. Dudley, G. Tolis, D. Gordon-Smith and C. Fazi, "A New Diagnostic Tool for the Characterization of the Damage Accompanying the Breakdown of p-n Junctions on Silicon'', Mater. Sci. & Engin., B15, 56-62, (1992).
46. X.M. Li, F.P. Chiang, J. Wu and M. Dudley, "Experimental Measurement of the Crack Tip Strain Field in a Single Crystal'', Engin. Fracture Mech., 43, 171-184, (1992).
47. M. Dudley and G.-D. Yao, "Synchrotron Topography of Phase Transitions in Perovskite-Like Crystals'', J. Phys. D: Appl. Phys., 26, 120-125, (1993).
48. C. Fazi, M. Dudley, S. Wang, and D. Gordon-Smith, "Observation of R-F Induced Failures in Silicon Bipolar Junctions Using Synchrotron X-ray Topographic Imaging'', in Army Science: The New Frontiers, D. Kamely and R. Sasmor (Eds.), Borg Biomedical Services, 182-190, (1993).
49. F.P. Chiang, X.M. Li, J. Wu and M. Dudley, "Experimental Measurement of Crack Tip Strain Field in a Single Crystal'', in Proceedings of the International Seminar Mecamat '91, C. Teodosiu, J.L. Raphanel, and F. Sidoroff (Eds.), A.A. Balkema, Rotterdam, NL, (1993) pp. 143-151.
50. L.G. Casagrande, D. DiMarzio, M.B. Lee, D.J. Larson, Jr., M. Dudley, and T. Fanning, "Characterization of Large-Diameter Single-Crystal CdTe Grown by the Vertical Bridgman Method'', J. Crystal Growth, 128, 576-581, (1993).
51. C.-H. Su, M.P. Volz, D.C. Gillies, F.R. Szofran, S.L. Lehoczky, G.-D. Yao, and M. Dudley, "Growth of ZnTe by Physical Vapor Transport and Traveling Heater Method'', J. Crystal Growth, 128, 627-632, (1993).
52. F. Liu, I. Baker, and M. Dudley, "Dynamic Observations of Dislocation Generation at Grain Boundaries in Ice'', Phil. Mag.A, 67, 1261-1276, (1993).
53. I. Baker, F. Liu, and M. Dudley, "Dynamic Observations of Dislocation Generation at Grain Boundaries in Ice'', in Proceedings of the 6th International Conference on Intergranular and Interphase Boundaries, Thessalonika, Greece, June (1992), Materials Science Forum, 126-128, 543-546, (1993).
54. C. Fazi, M. Dudley, S. Wang, and D. Gordon-Smith, "Observation of R-F Induced Failures in Silicon Bipolar Junctions Using Synchrotron X-ray Topographic Imaging'', Proceedings of 18th Army Science Conference, Orlando, June, (1992).
55. T. Fanning, M. Dudley, M.B. Lee, L.G. Casagrande, and D. DiMarzio, "White Beam X-ray Synchrotron Topography Analysis of CdTe(111) Substrates and Epilayers'', J. Electronic Materials, 22, 943-949, (1993).
56. D.J. Larson, Jr., R.P. Silberstein, D. DiMarzio, F.C. Carlson, D. Gillies, G. Long, M. Dudley, and J.Wu, "Compositional, Strain Contour and Property Mapping of CdZnTe Boules and Wafers'', Semiconductor Science & Technology, 8, 911-915, (1993).
57. M. Dudley, "X-ray Topography'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', D.L. Perry, R. Stockbauer, N. Shinn, K. D'Amico, and L. Terminello (Eds.) Mat. Res.Soc. Symp. Proc., 307, 213-224, (1993).
58. S. Wang, M. Dudley, L.K. Cheng, and J.D. Bierlein, "Synchrotron X-ray Topographic Study of Defects in High Quality, Flux Grown KTiOPO4Single Crystals'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', D.L. Perry, R. Stockbauer, N. Shinn, K. D'Amico, and L. Terminello (Eds.) Mat. Res. Soc. Symp. Proc., 307, 243-248, (1993).
59. S. Wang, M. Dudley, C. Carter, Jr., D. Asbury and C. Fazi, "Characterization of Defect Structures in SiC Single Crystals Using Synchrotron X-ray Topography'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', D.L. Perry, R. Stockbauer, N. Shinn, K. D'Amico, and L. Terminello (Eds.) Mat. Res. Soc. Symp. Proc., 307, 249-254, (1993).
60. S. Wang, M. Dudley, C. Fazi and D. Gordon-Smith, "Investigation of Filamentation Damage Resulting from Electromagnetic Breakdown in Si Bi-Polar Diodes'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', D.L. Perry, R. Stockbauer, N. Shinn, K. D'Amico, and L. Terminello (Eds.) Mat. Res. Soc. Symp. Proc., 307, 237-242, (1993).
61. J. Wu and M. Dudley, "Synchrotron White Radiation X-ray Topographic Investigation of Dislocation Configurations Developed in Indium Antimonide Single Crystals by Plastic Bending'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', D.L. Perry, R. Stockbauer, N. Shinn, K. D'Amico, and L. Terminello (Eds.) Mat. Res. Soc. Symp. Proc., 307, 231-236, (1993).
62. S. Wang, M. Dudley, L.K. Cheng, J.D. Bierlein and W. Bindloss, "Imaging of Ferroelectric Domains in KTiOPO4 Single Crystals by Synchrotron X-ray Topography'', in "Ferroelectric Thin Films III'', E.R. Myers, B.A. Tuttle, S.B. Desu, and P.K. Larsen (Eds.) Mat. Res. Soc. Symp. Proc., 310, 29-34, (1993).
63. M. Dudley, F. Liu, and I. Bakerand I. Baker, "Studies of Defect Behavior in Large-Grain, Polycrystalline Ice Using Synchrotron X-ray Topography'', Mol. Cryst. Liq. Cryst., 240, 73-80, (1993).
64. C.-H. Su, Y.-G. Sha, M.P. Volz, D.C. Gillies, F.R. Szofran, S.L. Lehoczky, W. Zhou, M. Dudley, H.-C. Liu, R.F. Brebrick, and J.C. Wang, "Ground-Based Research of Crystal Growth of II-VI Compound Semiconductors by Physical Vapor Transport'', in "Proceedings of 32nd AIAA Aerospace Sciences Meeting'', Reno, NV, 1994, Paper No. AIAA 94-0564, American Institute of Aeronautics and Astronautics, Inc., (1994).
65. W. Zhou, M. Dudley, C.H. Su, M.P. Volz, D. Gillies, F.R. Szofran, and S.L. Lehoczky, "Characterization of Growth Defects in ZnTe Single Crystals'', in "Infrared Detectors - Materials, Processing, and Devices'', A. Applebaum and L.R. Dawson (Eds.) Mat. Res. Soc. Symp. Proc., 299, 203-208, (1994).
66. M. Dudley, "Characterization by X-ray Topography'', in Encyclopedia of Advanced Materials, Vol. 4, D. Bloor, R.J. Brook, M.C. Flemings and S. Mahajan (Eds.), Pergamon, 2950-2956, (1994) (Commissioned Review Article).
67. C. Fazi, M. Dudley, S. Wang, and M. Ghezzo, "Issues Associated with Large Area SiC Diodes with Avalanche Breakdown''in SiC and Related Materials, M.G. Spencer, R.P. Devaty, J.A. Edmond, M. Asif Khan, R. Kaplan, and M. Rahman (Eds.), International Institute of Physics Conference Series Number 137, Institute of Physics Publishing, Bristol and Philadelphia, 487-490, (1994).
68. L.G. Casagrande, D.J. Larson, Jr., D. DiMarzio, J. Wu, and M. Dudley, "The Growth and Comparison of Large-Diameter, Vertical Bridgman CdZnTe and CdTe'', J. Crystal Growth, 137, 195-200, (1994).
69. M. Dudley, J. Wu, D.J. Larson, and D. DiMarzio, "Use of White Beam X-ray Topography to Characterize IR Detector Manufacturing Processes'', in "Diagnostic Techniques for Semiconductor Materials Processing'', O.J. Glembocki, F.H. Pollak, S.W. Pang, G. Larrabee, and G.M. Crean (Eds.), Mat. Res. Soc. Symp. Proc., 324, 457-462, (1994).
70. D. DiMarzio, D.J. Larson, Jr., L.G. Casagrande, J. Wu, M. Dudley, S. Tobin, and P. Norton, "Large Area X-ray Topographic Screening of II-VI Substrates and Epilayers'', in "Producibility of II-VI Materials and Devices'', H.K. Pollehn and R. Balcerak (Eds.), SPIE Proc., 2228, 289-300, (1994).
71. L.G. Casagrande, D.J. Larson, Jr., D. DiMarzio, J. Wu, and M. Dudley, "Growth of Large-Area, High Quality CdZnTe Substrates by the Computer Controlled Vertical Bridgman Method'', in "Producibility of II-VI Materials and Devices'', H.K. Pollehn and R. Balcerak (Eds.), SPIE Proc., 2228, 21-32, (1994).
72. D.J. Larson, Jr., D. DiMarzio, L.G. Casagrande, F.M. Carlson, T. Lee, B. Steiner, G. Long, D.G. Seiler, J. Wu, and M. Dudley, "Producibility Improvements Suggested by a Validated Process Model of Seeded CdZnTe Vertical Bridgman Growth'', in "Producibility of II-VI Materials and Devices'', H.K. Pollehn and R. Balcerak (Eds.), SPIE Proc, 2228, 11-20, (1994).
73. I. Baker, F. Liu, M. Dudley, and D. Black, "In Situ Synchrotron X-ray Topographic Studies of Polycrystalline Ice'', Proceedings of IAHR Ice Symposium 1994, Trondheim, Norway, pp. 416-425, (1994).
74. F. Liu, I. Baker, and M. Dudley, and D. Black, "Dislocation/Grain Boundary Interactions in Ice Under Creep Conditions'', Proceedings of IAHR Ice Symposium 1994, Trondheim, Norway, pp. 484-493, (1994).
75. S. Wang, M. Dudley, C.H. Carter, Jr., and H.S. Kong, "X-ray Topographic Studies of Defects in PVT 6H-SiC Substrates and Epitaxial 6H-SiC Thin Films'', in " Diamond, Silicon Carbide and Nitride Wide-Bandgap Semiconductors'', C.H. Carter, Jr., G. Gildenblat, S. Nakamura, and R.J. Nemanich (Eds.), Mat. Res. Soc. Symp. Proc., 339, 735-740, (1994).
76. W. Zhou, M. Dudley, C.H. Su, M.P. Volz, D. Gillies, F.R. Szofran, and S.L. Lehoczky, "Synchrotron Topography Characterization of ZnTe Single Crystal'', Mater. Sci. & Engin. B27, 143-153, (1994).
77. C. Fazi, M. Dudley, and M. Ghezzo, "Silicon Carbide: An Emerging Electronics Technology for High Temperature, High-Electromagnetic-Field Environments'', Government Microcircuit Applications Conference Digest of Papers, Vol. XX, 174-177, (1994).
78. C. Fazi, M. Dudley, S. Wang, and M. Ghezzo, "Silicon Carbide: An Emerging Electronics Technology for High Temperature, High-Electromagnetic-Field Environments'', Proceedings of 19th Army Science Conference, Orlando, June, (1994).
79. D. DiMarzio, D.J. Larson, Jr., L.G. Casagrande, J. Wu, M. Dudley, and P.-K. Liao, "Defect Mapping of CdZnTe Substrates'', in Proceedings of the 1993 IRIS Specialty Group on Infrared Materials, (August 16-17, 1993), ERIM, Ann Arbor, MI, pp. 69-86, (1994).
80. M. Dudley, S. Wang, W. Huang, C.H. Carter, Jr., and C. Fazi, "White Beam Synchrotron Topographic Studies of Defects in 6H-SiC Single Crystals'', J. Phys. D: Appl. Phys., 28, A63-A68, (1995).
81. M. Dudley, W. Huang, S. Wang, J.A. Powell, P. Neudeck, and C. Fazi, "White Beam Synchrotron Topographic Analysis of Multipolytype SiC Device Configurations'', J. Phys. D: Appl. Phys., 28, A56-A62, (1995).
82. . F. Liu, I. Baker, and M. Dudley, "Thermally Induced Dislocation Loops and Stacking Faults in Polycrystalline Ice'', Phil. Mag., 71, 1-15, (1995).
83. F. Liu, I. Baker, and M. Dudley, "Dislocation/Grain Boundary Interactions in Ice Crystals'', Phil. Mag., 71, 15-41, (1995).
84. S. Wang, M. Dudley, C.H. Carter, Jr., V.F. Tsvetkov and C. Fazi, "Synchrotron White Beam Topography Studies of Screw Dislocations in 6H-SiC Single Crystals'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', L. Terminello, N. Shinn, G. Ice, K. D'Amico, and D. Perry (Eds.), Mat. Res. Soc. Symp. Proc., 375, 281-286, (1995).
85. W. Huang, S. Wang, M. Dudley, P. Neudeck, J.A. Powell, and C. Fazi, "Computer Aided Synchrotron White Beam X-ray Topographic Analysis of Multipolytype SiC Device Configurations'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', L. Terminello, N. Shinn, G. Ice, K. D'Amico, and D. Perry (Eds.), Mat. Res. Soc. Symp. Proc., 375, 327-332, (1995).
86. W. Huang, S. Wang, M. Dudley, P. Neudeck, J.A. Powell, and C. Fazi, "Characterization of Defect Structures in Lely 6H-SiC Single Crystals Using Synchrotron White Beam X-ray Topography'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', L. Terminello, N. Shinn, G. Ice, K. D'Amico, and D. Perry (Eds.), Mat. Res. Soc. Symp. Proc., 375, 313-318, (1995).
87. F. Liu, I. Baker and M. Dudley, "A New Method to Characterize Dislocations Loops'', in "Applications of Synchrotron Radiation Techniques to Materials Science'', L. Terminello, N. Shinn, G. Ice, K. D'Amico, and D. Perry (Eds.), Mat. Res. Soc. Symp. Proc., 375, 319-325, (1995).
88. H. Chung, B. Raghothamachar, J. Wu, M. Dudley, D.J. Larson, Jr., and D.C. Gillies, "Characterization of Growth Defects in CdZnTe Single Crystals by Synchrotron White Beam X-ray Topography", in "Defect and Impurity-Engineered Semiconductors and Devices", S. Ahok, J. Chevallier, I. Akasaki, N.M. Johnson, and B.L. Sopori (Eds.), Mat. Res. Soc. Symp. Proc., 378, 41-46, (1995).
89. S.P. Tobin, F.T.J. Smith, P.W. Norton, J. Wu, M. Dudley, D. DiMarzio and L. Casagrande, "The Relationship Between Lattice Matching and Crosshatch in LPE HgCdTe on CdZnTe Substrates'', J. Electronic Materials, 24, 1189-1199, (1995).
90. S. Wang, M. Dudley, W. Huang, C.H. Carter, Jr., V.F. Tsvetkov and C. Fazi, "Characterization of Defects in Silicon Carbide Single Crystals by Synchrotron X-ray Topography", in Proceedings of International Workshop on Semiconductor Characterization: Present Status and Future Needs", W. Murray Bullis, David G. Seiler and Alain Diebold (Eds.), American Institute of Physics, pp. 278-282, (1995).
91. M. Dudley and W.M. Vetter, "Growth Defect Studies in SiC Single Crystals", Mol. Cryst Liq. Cryst., 278, 37-46, (1996).
92. H. Chung, M. Dudley, M.E. Brown, and M.D. Hollingsworth, "Synchrotron White Beam X-ray Topography Characterization of Defect Structures in 2,10 Undecanedione/Urea Inclusion Compounds", Mol. Cryst Liq. Cryst., 276, 203-212, (1996).
93. X. Hu, I. Baker, and M. Dudley, "In Situ X-ray Topographic Observations of Notches in Ice", Scripta Met., 34, 491-497, (1996).
94. G.M. Watson, B.D. Gaulin, D. Gibbs, G.H. Lander, T.R. Thurston, P.J. Simpson, H.J. Matzke, S. Wang, M. Dudley, and S. Shapiro, "On the Origin of the Second Length Scale Found Above TN in UO2", Phys. Rev. B, 53, 686-698, (1996).
95. K. Jia, I. Baker, F. Liu, and M. Dudley, "Observation of Slip Transmission Through a Grain Boundary in Ice", J. Mater. Sci., 31, 2373-2378, (1996).
96. W. Huang, Q. Wang, M. Dudley, F.P. Chiang, J. Parsons, and C. Fazi, "Synchrotron White Beam Topography Studies of Residual Stress in SiC Single Crystals Wafers with Epitaxial Thin Films", in "Evolution of Epitaxial Structure and Morphology" A. Zangwill, D. Jesson, R. Clarke, and D. Chambliss (Eds.), Mat. Res. Soc. Symp. Proc., 399, 425-430, (1996).
97 W.M. Vetter and M. Dudley, "Characterization of Micropipes and other Defect Structures in 6H-SiC Through Fluorescence Microscopy", in "Diagnostic Techniques for Semiconductor Materials Processing", O. Glembocki, S.W. Pang, F.H. Pollack, and F. Celii (Eds.), Mat. Res. Soc. Symp. Proc., 406, 561-566, (1996).
98. W. Si, M. Dudley, P. Li and R. Wu, "Solid State Interfacial Reactions Between TiC Thin Films and Ti3Al Substrates" to appear in "Thermodynamics and Kinetics of Phase Transformations", Mat. Res. Soc. Symp. Proc., 398, 275-280, (1996).
99. W. Si, M. Dudley, P. Li and R. Wu, "Microstructure and Interfaces in TiB2/Ti-46Al-3Cr Alloy Composites", in "Covalent Ceramics III-Science and Technology of Non-Oxides", A.F. Hepp, G.S. Fischmann, P.N. Kumpta, A.E. Kaloyeros, and J.J. Sullivan (Eds.), ", Mat. Res. Soc. Symp. Proc., 410, 405-410, (1996).
100. Weimin Si, Hua Chung, Michael Dudley, Vish Prasad, Andrew Anselmo, and David F. Bliss, "Study of Defect Structures in MLEK Grown InP Single Crystals by Synchrotron White Beam X-ray Topography", in Proceedings of the Eighth International Conference on Indium Phosphide and Related Materials, pp. 610-613. , Institute of Electrical and Electronics Engineers, Inc., (1996).
101. H. Chung, B. Raghothamachar, M. Dudley, D.J. Larson, Jr.," Synchrotron White Beam X-Ray Topography Characterization of Structural Defects in Microgravity and Ground Based CdZnTe crystals", in "Space Processing of Materials", SPIE Proceedings Vol. 2809, 45-56, (1996).
102. Weimin Si, Michael Dudley, Calvin H. Carter, Jr., Robert Glass, and Valeri F. Tsvetkov, "Determination of Burgers Vectors of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-ray Topography", in "Applications of Synchrotron Radiation to Materials Science", L. Terminello, S. Mini, D. L. Perry, and H. Ade (Eds.), Mat. Res. Soc. Symp. Proc., 437, 129-134, (1996).
103. X. Hu, I. Baker, and M. Dudley, "Dynamic In Situ Synchrotron X-ray Topographic Observations of Dislocations in Notched Ice Crystals", in "Applications of Synchrotron Radiation to Materials Science", L. Terminello, S. Mini, D. L. Perry, and H. Ade (Eds.), Mat. Res. Soc. Symp. Proc., 437, 119-124, (1996).
104. H. Chung, B. Raghothamachar, W. Zhou, M. Dudley, D.C. Gillies "Studies of Interface Demarcation and Structural Defects in Ga doped Ge Single Crystals by Synchrotron White Beam X-Ray Topography", in "Applications of Synchrotron Radiation to Materials Science", L. Terminello, S. Mini, D. L. Perry, and H. Ade (Eds.), Mat. Res. Soc. Symp. Proc., 437, 107-112, (1996).
105. W. Si, M. Dudley, H. S. Kong, J. Sumakeris, and C. H. Carter, Jr., "Investigations of 3C-SiC inclusions in 4H-SiC epitaxial films grown on 4H-SiC single crystal substrates", J. Electronic Materials, 26, 1-9, (1997).
106. W. Si, M. Dudley, R. Glass, V. Tsvetkov, and C. H. Carter, Jr., "Hollow-core screw dislocations in 6H-SiC single crystals: a test of Frank's theory", J. Electronic Materials, 26, 128-133, (1997).
107. B.M. Park, S.J. Chung, H.S. Kim, W. Si, and M. Dudley, "Synchrotron White Beam X-ray Topography of Ferroelectric Domains in BaTiO3 Single Crystal", Phil. Mag. A, 75, 611-620, (1997).
108. W. Huang, M. Dudley, C. Fazi, "Characterization of Defect Structures in 3C-SiC Single Crystals", in "III-Nitride, SiC and Diamond Materials for Electronic Devices", D. K. Gaskill, C. Brabdt and R. J. Nemanich (Eds.), Mat. Res. Soc. Symp. Proc., 423, 545-550, (1996).
109. M. Dudley, W. Si, S. Wang, C.H. Carter, Jr., R. Glass, and V.F. Tsvetkov, "Quantitative Analysis of Screw Dislocations in 6H-SiC Single Crystals", Il Nuovo Cimento, 19D, 153-164, (1997).
110. D.R. Rhiger, S. Sen, J.M. Peterson, H. Chung, and M. Dudley "Lattice Mismatch Induced Morphological Features and Strain in HgCdTe Epilayers on CdZnTe Substrates", J. Electronic Materials, 26, 515-523, (1997).
111. W.M. Vetter and M. Dudley, "X-ray Topography of a Single Superscrew Dislocation in 6H-SiC", in "Defects in Electronic Materials II", Mat. Res. Soc. Symp. Proc., 442, 661-665, (1997). 112. H. Chung, W. Si, M. Dudley, A. Anselmo, D. F. Bliss, A. Maniatty, H. Zhang and V. Prasad, "Characterization of Structural Defects in MLEK Grown InP Single Crystals Using Synchrotron White Beam X-Ray Topography", J. Crystal Growth, 174, 230-237, (1997). 113. M. Dudley, "Topography, X-ray", Encyclopedia of Applied Physics, G.L. Trigg (Ed.), Wiley-VCH Verlag GmbH, Vol. 21, pp. 533-547, (1997) (Commissioned Review Article). 114. X. Hu, I. Baker, and M. Dudley, "Temperature Dependence of Dislocations in Notched Ice Crystals", J. Phys. Chem. B, 101, 6102-6104, (1997). 115. H. Chung, W. Si, M. Dudley, A. Anselmo, D. F. Bliss, A. Maniatty, H. Zhang and V. Prasad, "Characterization of Defect Structures in Liquid Encapsulated Kyropoulos Grown InP Single Crystals", J. Crystal Growth, 181, 17-25, (1997). 116. W. Palosz, D. Gillies, K. Grasza, H. Chung, B. Raghothamachar and M. Dudley "Characterization of cadmium-zinc telluride crystals grown by `contactless' PVT using synchrotron white beam topography", J. Crystal Growth, 182, 37-52, (1997). 117. D.R. Rhiger, J.M. Peterson, R.M. Emerson, E.E. Gordon, S. Sen, Y. Chen and M. Dudley "Investigation of the Cross-Hatch Pattern and Localized Defects in Epitaxial HgCdTe", J. Electronic Materials, 26, 515-523, (1998). 118. H. Chung, M. Dudley, D. J. Larson, Jr., D. T. J. Hurle, D. F. Bliss and V. Prasad "The Mechanism of Growth-Twin Formation in Zincblende Crystals: New Insights from a Study of Magnetic Liquid Encapsulated Czochralski Grown InP Single Crystals", J. Crystal Growth, 187, 9-17, (1998). 119. W. Si and M. Dudley, R. Glass, V. Tsvetkov, and C.H. Carter, Jr., "Study of Hollow-Core Screw Dislocations in 6H-SiC and 4H-SiC Single Crystals" in Silicon Carbide, III-Nitrides, and Related Materials 1997, G. Pensl, H. Morkoc, B. Monemar, and E. Janzen (Eds.), Materials Science Forum, 264-268, 429-432,. Switzerland: Trans Tech Publications, Switzerland, (1998). 120. W.M. Vetter and M. Dudley, "Characterization of Defects in p-Quaterphenyl Single Crystals", Mol. Cryst. Liq. Cryst., 313, 293-301, (1998). 121. H. Chung, M. Dudley, D.J. Larson, Jr., V. Prasad, D.T.J. Hurle, and D.F. Bliss, "Growth Twinning in Zincblende Crystals: Further Insights from Studies of Magnetic Liquid Encapsulated Czochralski (MLEC) Grown InP Single Crystals, in "Proceedings of the Tenth International Conference on Indium Phosphide and Related Materials", Tsukuba Japan, May 11-15, 1998, pp.84-87, IEEE Lasers and Electro- Optics Society, (1998). 122. M. Dudley, B. Raghothamachar, Y. Guo, X.R. Huang, H. Chung, D. T. J. Hurle, and D. F. Bliss, "The Influence of Polarity on Twinning in Zincblende Structure Crystals: New Insights from a Study of Magnetic Liquid Encapsulated, Czochralski Grown InP Single Crystals" J. Crystal Growth, 192, 1-10, (1998). 123. B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson, Jr., "Effect of Constrained Growth on the Defect Structures in Microgravity Grown CdZnTe Boules", J. Electronic Materials, 27, 556-563, (1998). 124. P.G. Neudeck, W. Huang, M. Dudley, and C. Fazi, "Non-Micropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications", in "Wide-Bandgap Semiconductors for High Power, High Frequency and High Temperature", S. DenBaars, J. Palmour, M. Shur, and M. Spencer (Eds.), Mat. Res. Soc. Symp. Proc., 512,107-112, (1998). 125. X.R. Huang, M. Dudley, W.M. Vetter, W. Huang and C.H. Carter, Jr., "Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs", in "Applications of Synchrotron Radiation Techniques to Materials Science IV", S.M. Mini, D.L. Perry, S.R. Stock, and L.J. Terminello (Eds.), Mat. Res. Soc. Symp. Proc., 524, 71-76, (1998). 126. M. Dudley, B. Raghothamachar, Y. Guo, X.R. Huang, H. Chung, D.J. Larson, Jr., D.T.J. Hurle, D.F. Bliss, V. Prasad, and Z. Huang, "The Mechanism of Twinning in Zincblende Structure Crystals: New Insights on Polarity Effects from a Study of Magnetic Liquid Encapsulated Czochralski Grown InP Single Crystals", in "Applications of Synchrotron Radiation Techniques to Materials Science IV", S.M. Mini, D.L. Perry, S.R. Stock, and L.J. Terminello (Eds.), Mat. Res. Soc. Symp. Proc., 524, 65-70, (1998). 127. P.G. Neudeck, W. Huang, and M. Dudley, "Breakdown Degradation Associated with Elementary Screw Dislocations in 4H-SiC P+N Junction Rectifiers", Solid State Electronics, 42, 2157-2164, (1998). 128. W.M. Vetter and M. Dudley, "Harmonic Composition of Synchrotron White-Beam X-ray Topographic Back-Reflection Images of Basal-Cut Silicon Carbide Single-Crystal Wafers" J. Appl. Cryst.. 31, 820 - 822, (1998). 129. M. Dudley, D.J. Larson Jr., H. Chung, and B. Raghothamachar, "Characterization of Zn-Alloyed CdTe Compound Semiconductors Processed in Microgravity on USML-1 and USML-2", in Proceedings of 31st COSPAR Scientific Assembly, Birmingham, UK, July 14-21, 1996, Advances in Space Research, 22, 1179-1188, (1998). 130. X.R. Huang, M. Dudley, W. M. Vetter, W. Huang, S. Wang, and C. H. Carter, Jr., "Direct evidence of micropipe-related pure superscrew dislocations in SiC", Appl. Phys. Lett., 74,, 353-355, (1999). 131. P. Neudeck, W. Huang, and M. Dudley, "Study of Bulk and Elementary Screw Dislocation Assisted Reverse Breakdown in Low-Voltage (<250V) 4H-SiC p+n Junction Diodes - Part I: DC Properties, IEEE Trans. Electron. Devices, 46, 478-484, (1999). 132. X. R. Huang, M. Dudley, W. M. Vetter, W. Huang, and W. Si, and C. H. Carter, Jr., "Superscrew dislocation contrast on synchrotron white-beam topographs: An accurate description of the direct dislocation image", J. Appl. Cryst., 32, 516-524, (1999). 133. M. Dudley, X.R. Huang, and W. Huang "Assessment of Orientation and Extinction Contrast Contributions to the Direct Dislocation Image", J. Phys. D: Appl. Phys., 32, A139-A144, (1999). 134. J. Su, H. Chung, Y. Guo, M. Dudley, H.M. Volz, C. Salles, and R.J. Matyi, "Characterization of Microgravity and Ground-Based Grown Crystals Using Synchrotron White Beam X-ray Topography and High Resolution Triple Axis X-ray Diffraction", Advances in X-ray Analysis, 41, 148-154, 1999. 135. B. Raghothamachar, H. Chung, M. Dudley, D. Larson, Jr., "Synchrotron White Beam X-ray Topography Studies of Structural Defects in Microgravity Grown CdZnTe Single Crystals", Advances in X-ray Analysis, 41, 195-202, 1999. 136. M. Dudley, X.R. Huang, W. Huang, A. Powell, S. Wang, P. Neudeck, and M. Skowronski, "The Mechanism of Micropipe Nucleation at Inclusions in Silicon Carbide, Appl. Phys. Lett., 75,, 784-786, (1999). 137. X.R. Huang, M. Dudley, J.Y. Zhao, and B. Raghothamachar, "Dependence of the Direct Dislocation Image on Sample-to-Film Distance in X-ray Topography:, Phil. Trans. R. Soc. Lond., A357, 1-12, (1999). 138. S.E. Saddow, M.E. Okhuysen, M.S. Mazzola, M. Dudley, X.R. Huang, W. Huang and M. Shamsuzzoha, "Characterization of Single-Crystal 3C-SiC on Si Epitaxial Layers", in "III-V and IV-IV Materials and Processing Challenges for Highly Integrated Microelectronics and Optoelectronics", S.A. Ringel, E.A. Fitzgerald, I. Adesida, and D. Houghton (Eds.), Mat. Res. Soc. Symp. Proc., 535, 107-112, (1999). 139. C.-H. Su, M. Dudley, R. Matyi, S. Feth, and S.L. Lehoczky, "Characterizations of ZnSe Single Crystals Grown by Physical Vapor Transport", J. Crystal Growth, 208, 237-247, (2000). 140. M. Dudley and X. Huang, "Characterization of SiC Using Synchrotron White Beam X-ray Topography", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty and G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 431-436, Trans Tech Publications, Switzerland, (2000). 141. M. Shamsuzzoha, S. E. Saddow, L. Jin, T. E. Schattner, M. Dudley, S. V. Rendakova, and V. A. Dmitriev "Structural Investigation on the Nature of Surface Defects Present in Silicon Carbide Wafers Containing Varying Amount of Micropipes", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty and G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 453-456 , Trans Tech Publications, Switzerland, (2000). 142. M. Dudley, W. Huang, W.M. Vetter, P. Neudeck and J.A. Powell, "Synchrotron White Beam Topography Studies of 2H SiC Crystals", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty and G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 465-468, Trans Tech Publications, Switzerland, (2000). 143. M. Dudley, W.M. Vetter, W. Huang, P. Neudeck and J.A. Powell, "Synchrotron White Beam X-ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty and G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 469-472, Trans Tech Publications, Switzerland, (2000). 144. T.A. Kuhr, W.M. Vetter, M. Dudley, and M. Skowronski, "X-ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 473-476, Trans Tech Publications, Switzerland, (2000). 145. C.M. Schnabel, M. Tabib-Azar, P.G. Neudeck, S.G. Bailey, H.B. Su, and M. Dudley, "Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes", in Silicon Carbide, III-Nitrides, and Related Materials 1999, C.H. Carter, Jr., R. P. Devaty and G.S. Rohrer (Eds.), Materials Science Forum, 338-342, pp. 489-492 , Trans Tech Publications, Switzerland, (2000). 146. D. Cullen, X. Hu, I. Baker and M. Dudley, "Dislocation Motion Around Loaded Notches in Ice Single Crystals", in "Applications of Synchrotron Radiation Techniques to Materials Science V", S.R. Stock, D.L. Perry, S.M. Mini (Eds.), Mat. Res. Soc. Symp. Proc., 590, 291-296, (2000). 147. D.F. Bliss, G. Bryant, G. Antypas, B. Rhaghothamachar, G. Dhanaraj, M. Dudley, and J. Zhao "X-ray Characterization of Bulk InP:S Crystals Grown by LEC in a Low Thermal Gradient", in "Proceedings of 12th International Conference on Indium Phosphide and Related Materials" Williamsburg, VA, May 2000, 530-533, (2000). 148. D.F. Bliss, "Recent Progress in Bulk InP Crystal Growth", in Proceedings of 2nd International School on Crystal Growth Technology, Zao, Japan, August 2000, pp. 374-412, (2000). 149. W. M. Vetter and M. Dudley, "Micropipes in Silicon Carbide Crystals: Do All Screw Dislocations have Open Cores?" J. Mater. Res., 15, 1649-52, (2000). 150. D. Cullen, X. Hu, I. Baker and M. Dudley, "Dislocation Motion at Notch-Tips in Ice Single Crystals: Experiments and Interpretation", Cold Regions Science and Engineering, 31, 103-117, (2000). 151. I. Baker, F. Liu, K. Jia, X. Hu, D. Cullen and M. Dudley "X-ray Topographic Observations of Dislocation/Grain Boundary Interactions in Ice", I. Baker , Annals of Glaciology, 31, 236-240, (2000). 152. W. M. Vetter and M. Dudley, "X-Ray Topographic Dislocation Contrast Visible in Reflections Orthogonal to the Burgers Vectors of Axial Screw Dislocations in Hexagonal Silicon Carbide", J. Appl. Cryst., 34, 20-26, (2001). 153. X. R. Huang, M. Dudley and J. Y. Zhao, "Forbidden X-ray wavefields of three-beam Bragg reflections from thick crystals", Acta Cryst.A., (2000) (In Press). 154. P.G. Neudeck, M.A. Kuczmarski, M. Dudley, W.M. Vetter, and H. Su, "Electrical Behavior of X-ray Imaged Defects in SiC High Field Devices", in "Wide-Bandgap Electronic Devices", R.J. Shul, F. Ren, W. Pletschen, and M. Murakami (Eds.), Mat. Res. Soc. Symp. Proc., 622, (2000) (In Press). 155. W. M. Vetter, W. Huang, P. Neudeck, J. A. Powell, M. Dudley, "Synchrotron White-Beam Topographic Studies of 2H-SiC Crystals", J. Cryst. Growth, (2001) (In Press). 156. W. M. Vetter and M. Dudley, "Transmission Electron Microscopic Studies of Dislocations in PVT-Grown Silicon Carbide I: Micropipes", Submitted to Phil. Mag. A., (2000). 157. W. M. Vetter and M. Dudley. "Transmission Electron Microscopic Studies of Dislocations in PVT-Grown Silicon Carbide II: Basal Plane Dislocations", Submitted to Phil. Mag. A., (2000). 156. X. R. Huang, M. Dudley and J. Y. Zhao, "Forbidden X-ray wavefields of three-beam Bragg reflections from thick crystals", Acta Cryst.A57., 68-75, (2001). 157. M. Dudley, X.R. Huang, W.M. Vetter, and G. Dhanaraj, "Synchrotron White Beam X-ray Topography Characterization of Defects in Technologically Important SiC and InP Single Crystals", in "Crystal Growth and Characterization: Proceedings of International Workshop on the Preparation and Characterization of Technologically Important Single Crystals", S.K. Gupta, S.K. Halder, and G. Bhagavannarayana (Eds.), National; Physical Laboratory New Delhi, Feb. 26-28, 2001, pp. 44-51, (2001). 158. V. Prasad, Q.-S. Chen, H. Zhang, and M. Dudley, "Role of Modeling in Process and System Devlopment for Crystal Growth", in "Crystal Growth and Characterization: Proceedings of International Workshop on the Preparation and Characterization of Technologically Important Single Crystals", S.K. Gupta, S.K. Halder, and G. Bhagavannarayana (Eds.), National; Physical Laboratory New Delhi, Feb. 26-28, 2001, pp. 95-102, (2001). 159. E.K. Sanchez, J. Liu, W.M. Vetter, M. Dudley, R. Bertke. W.C. Mitchel, and M. Skowronski, " Effect of Surface Finish on the Dislocation Density in Sublimation Grown SiC Layers", in "SiC - Materials, Processing and Devices", Mat. Res. Soc. Symp. Proc., 640, H1.3.1-H1.3.6, (2001). 160. S.E. Saddow, G. Melnychuk, M. Mynbaeva, I. Nikitina, W.M. Vetter, L. Jin, M. Dudley, M. Shamsuzzoha, V. Dmitriev, and C.E.C. Wood, "Structural Characterization of SiC Epitaxial LayersGrown on Porous SiC Substrates", in "SiC - Materials, Processing and Devices", Mat. Res. Soc. Symp. Proc., 640, H2.7.1-H2.7.6, (2001). 161. W. M. Vetter, W. Huang, P. Neudeck, J. A. Powell, M. Dudley, "Synchrotron White-Beam Topographic Studies of 2H-SiC Crystals", J. Cryst. Growth, 224, 269-273, (2001). 162. T. A. Kuhr, E. K. Sanchez, M. Skowronski, W. M. Vetter and M. Dudley, "Hexagonal Voids and the Formation of Micropipes During SiC Sublimation Growth", J. Appl. Phys., 89, 4625-4630, (2001). 163. J.C. Rojo, G.A. Slack, K. Morgan, B. Raghothamachar, M. Dudley, and L.J. Schowalter, " Report on the Growth of Bulk Aluminum Nitride and Susequent Substrate Preparation", J. Cryst. Growth, 231, 317-321, (2001). 164. W. M. Vetter and M. Dudley, "Transmission Electron Microscopic Studies of Dislocations in PVT-Grown Silicon Carbide", Phil. Mag., A81., 2885-2902. (2001). 165. W. M. Vetter and M. Dudley, Partial Dislocations in the X-ray Topography of As-Grown Hexagonal Silicon Carbide Crystals. Mater. Sci. Eng ., B87, 173-177, (2001). 166. E.K. Sanchez, S. Ha, J. Grim, M. Skowronski, W.M. Vetter, M. Dudley, R. Bertke and W.C. Mitchel, "Assessment of Polishing-Related Surface Damage in Silicon Carbide", J. Electrochem. Soc., 149, G131, (2002). 167. M. Dudley, B. Raghothamachar, H. Chen, A.J. Khan, S. Tiddrow, and C. Fazi, "Characterization of Defect and Strain Configurations in Langanite and Langatate Single Crystals using Synchrotron White Beam X-ray Topography and Assessment of their Influence on Resonator Performance" in Proceedings of 14th European Frequency and Time Forum, Turin Italy, March 14-16, 2000, in Press, (2001). 168. M. Dudley, B. Raghothamachar, H. Chen, W. Johnson, S. Tiddrow, A. Khan, and C. Fazi, "Diagnostic Synchrotron Topographic Imaging of Striations and other Defects in Langatate and Langanite Single Crystals and Assessment of their Influence on Resonator Performance" in Proceedings of 15th European Frequency and Time Forum, Neuchatel, Switzerland, March 6-8, 2001, FSRM (Swiss Foundation for Research in Microtechnology), Neuchatel, Switzerland, (2001), pp.284-288. 169. W. M. Vetter, T. Gallagher and M. Dudley, "Synchrotron White-Beam X-Ray Topography of Ribonuclease S Crystals", Acta Cryst., D58, 579-584, (2002). 170. E.K. Sanchez, J.Q. Liu, M. De Graef, M. Skowronski, W.M. Vetter, and M. Dudley, "Nucleation of Threading Dislocations in Sublimation Grown Silicon Carbide", J. Appl. Phys., 91, 1143-1148, (2002). 171. M. Dudley, W.M. Vetter, and P.G. Neudeck, "Polytype Identification in Heteroepitaxial 3C-SiC Grown on 4H-SiC Mesas Using Synchrotron White Beam X-ray Topography", J. Cryst. Growth, 240, 22, (2002). 172. M.D. Hollingsworth, M.E. Brown, M. Dudley, H. Chung, M.L. Peterson, and A.C. Hillier, "Template Effects, Asymmetry and Twinning in Helical Inclusion Compounds", Angew. Chem. Int. Ed., 41, 965-969, (2002). 173. M. Dudley, W.M. Vetter, P.G. Neudeck, and J.A. Powell, "Polytype Identification and Mapping in Hetroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White Beam X-ray Topography," in Silicon Carbide, III-Nitrides, and Related Materials 2001, S. Yoshida, S. Nishino, H. Harima, and T. Kimoto (Eds.), Materials Science Forum, 389-393, 391-394, Trans Tech Publications, Switzerland, (2002). 174. P.G. Neudeck, J.A. Powell, A. Trunek, X.R. Huang, and M. Dudley, "Growth of defect-Free 3C-SiC on 4H- and 6H-SiC Mesas Using Step-Free Surface Heteroepitaxy", Homoepitaxial "Web Growth" of SiC to Terminate c-axis Screw Dislocations and Enlarge Step-Free Surfaces", in Silicon Carbide, III-Nitrides, and Related Materials 2001, S. Yoshida, S. Nishino, H. Harima, and T. Kimoto (Eds.), Materials Science Forum, 389-393, 311-314, Trans Tech Publications, Switzerland, (2002). 175. P.G. Neudeck, J.A. Powell, A. Trunek, D. Spry, G.M. Beheim, E. Benavage, P. Abel, W.M. Vetter, and M. Dudley, "Homoepitaxial "Web Growth" of SiC to Terminate c-axis Screw Dislocations and Enlarge Step-Free Surfaces", in Silicon Carbide, III-Nitrides, and Related Materials 2001, S. Yoshida, S. Nishino, H. Harima, and T. Kimoto (Eds.), Materials Science Forum, 389-393, 251-254, Trans Tech Publications, Switzerland, (2002). 176. S. Ha, W.M. Vetter, M. Dudley and M. Skowronski, "A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers", in Silicon Carbide, III-Nitrides, and Related Materials 2001, S. Yoshida, S. Nishino, H. Harima, and T. Kimoto (Eds.), Materials Science Forum, 389-393, 443-446, Trans Tech Publications, Switzerland, (2002). 177. B.J. Skromme, K.C. Palle, C.D. Poweleit, L.R. Bryant, W.M. Vetter, M. Dudley, K. Moore, and T. Gehoski, "Oxidation-Induced Crystallographic Transformation in Heavily N-Doped 4H-SiC Wafers", in Silicon Carbide, III-Nitrides, and Related Materials 2001, S. Yoshida, S. Nishino, H. Harima, and T. Kimoto (Eds.), Materials Science Forum, 389-393, 455-458, Trans Tech Publications, Switzerland, (2002). 178. W.M. Vetter, H. Totsuka, M. Dudley, and B. Kahr, "The Perfection and Defect Structure of Organic Hourglass Inclusion K2SO4 Crystals", J. Cryst. Growth, 241, 498-506, (2002). 179. B. Raghothamachar, W. M. Vetter, M. Dudley, R. Dalmau, R. Schlesser, Z. Sitar, E. Michaels, and J.W. Kolis, "Synchrotron White Beam Topography Characterization of Physical Vapor Transport Grown AlN and Ammonothermal GaN", J. Cryst. Growth, 246, 271-280, (2002). 180. S. Ha, M. Skowronski, W.M. Vetter, and M. Dudley, "Basal Plane Slip and Formation of Mixed-Tilt Boundaries, in Sublimation-Grown Hexagonal Polytype Silicon Carbide Single Crystals", J. Appl. Phys., 92, 778-785, (2002). 181. P.G. Neudeck, J.A. Powell, G.M. Beheim, E.L. Benavage, P.B. Abel, A.J. Trunek, D.J. Spry, M. Dudley, and W.M. Vetter, "Enlargement of Step-Free SiC Surfaces by Homoepitaxial Web-Growth of Thin SiC Cantilevers", J. Appl. Phys., 92, 2391,-2400, (2002). 182. M. Skowronski, J.Q. Liu, W.M. Vetter, M. Dudley, C. Hallin, and H. Lendenmann, "Recombination-Enhanced Defect Motion in Forward-Biased 4H-SiC p-n Diodes," J. Appl. Phys., 92, 4699-4704, (2002). 183. "Stress of silicon carbide", Crystal Growth and Design, 2 (3), 213-220, (2002). 184. Balaji Raghothamachar, Jie Bai, William M. Vetter, Perena Gouma, Michael Dudley, Marina Mynbaeva, Matthew T. Smith, and Stephen E. Saddow, Characterization of Porous SiC Substrates and of the Epilayer Structures Grown on Them, Mater. Res. Soc. Symp. Proc., Vol. 742, K2.11 (2002). 185. J. Hartwig, J. Baruchel, H. Kuhn, X.R. Huang, M. Dudley, and E. Pernot, "X-ray "Magnifying" Imaging Investigation of Giant Burgers Vector Micropipe Dislocations in 4H-SiC", Nucl. Instr. & Meth., 200, 323-328, (2003). 186. U. Zimmermann, J. Osterman, D. Kuylenstierna, A. Hallen, A.O. Konstantinov, W.M. Vetter, and M. Dudley, "Material Defects in 4H-Silicon Carbide Diodes, J. Appl. Phys., 93, 611-618, (2003). 187. B. Raghothamachar, M. Dudley, J.C. Rojo, K. Morgan, and L.J. Schowalter, "X-ray Characterization of Bulk AlN Single Crystals Grown by the Sublimation Technique", J. Cryst. Growth, 250, 244-250, (2003). 188. X.R. Huang and M. Dudley, "A Universal Computation Method for Two-Beam Dynamical X-ray Diffraction", Acta Cryst., A59, 163-167, (2003). 189. B. Wu, R. Ma, H. Zhang, M. Dudley, R. Schlesser, Z. Sitar, "Growth kinetics and thermal stress in AlN bulk crystal growth", J. Cryst. Growth, 253, 326-339, (2003). 190. W.M. Vetter, J.Q. Liu, M. Dudley, M. Skowronski, H. Lendenmann, and C. Hallin, "Dislocation Loops Formed During the Degradation of Forward-Biased 4H- SiC p-n Junctions", Mater. Sci. & Engin., B98, 220-224, (2003). 191. P.G. Neudeck, J.A. Powell, D.J. Spry, A.J. Trunek, X Huang, W.M. Vetter, M. Dudley, M. Skowronski and J. Liu, "Characterization of 3C-SiC Films Grown on 4H- and 6H-SiC Substrate Mesas during Step-Free Surface Hetero- Epitaxy", in Silicon Carbide and Related Materials 2002, P. Bergman and E. Janzen (Eds.), Materials Science Forum, 433-436, 213-216, Trans Tech Publications, Switzerland, (2003). 192. M. Dudley, X Huang, W.M. Vetter, and P.G. Neudeck, "Synchrotron White Beam X-ray Topography and High Resolution Triple Axis X-ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices", in Silicon Carbide and Related Materials 2002, P. Bergman and E. Janzen (Eds.), Materials Science Forum, 433-436, 247-252, Trans Tech Publications, Switzerland, (2003). 193. R.-H. Ma, H. Zhang, M. Dudley, S. Ha, and M. Skowronski, "Modeling for mass transfer and Thermal Stress of Silicon carbide PVT growth", Proceedings of 2002 ASME International Mechanical Engineering Congress and Exposition, New Orleans, pp.1-9, ASME, (2003). 194. M. Dudley, "Studies of Defects and Strains Using X-ray Topography and Diffraction", in Proceedings of the 2003 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, Charlotte, NC, June 2-5, 2003, pp. 348-355, (2003). 195. W. Palosz, K. Grasza, K. Durose, D.P. Halliday, N.M. Boyall, M. Dudley, B. Raghothamachar, and L. Cai, "The Effect of Wall Contact and Post-Growth Cool- Down on Defects in CdTe Crystals Grown by "Contactless" Physical Vapor Transport", J. Cryst. Growth, 254, 316-328, (2003). 196. E.A. Preble, P.Q. Miraglia, A.M. Roskowski, W.M. Vetter, M. Dudley, and R.F. Davis, "Domain Structures in 6H-SiC Wafers and Their Effect on the Microstructures of GaN Films Grown on AlN and Al0.2GaN0.8N Buffers Layers", J. Cryst. Growth, 258, 75-83, (2003). 197. X. Ma, M. Dudley, W. Vetter, and T. Sudarshan, "Extended Defects: Polarized Light Microscopy Delineation and Synchrotron White Beam X-ray Topography Ratification", Jpn. J. Appl. Phys., 42, L1077-L1079, (2003). 198. R. Ma, H. Zhang, M. Dudley, and V. Prasad, "Thermal System Design and Dislocation Reduction for Growth of Wide Band-gap Crystals: Application to SiC Growth," J. Cryst. Growth, 258, 318-330, (2003). 199. R.-H. Ma, H. Zhang, M. Dudley, and V. Prasad, "Thermal System Design And Dislocation Reduction For Growth Of Wide Bandgap Crystals", Proceedings of HTC ASME Summer Heat Transfer Conference Las Vegas, Nevada, (2003). 200. R.S. Okojie, T. Holzheu, X.-R. Huang, and M. Dudley, "X-ray Diffraction Measurement of Doping-Induced Lattice Mismatch in n-Type 4H-SiC Epilayers Grown on p-Type Substrates", Appl. Phys. Letts., 83, 1971-1973, (2003). 201. M. Dudley, X.-R. Huang and W.M. Vetter, "Contribution of X-ray Topography and High Resolution Diffraction to the Study of Defects in SiC", J. Phys. D., Appl. Phys., 36, A30-A36, (2003). 202. W.M. Vetter and M. Dudley, "Open-Ended Stacking Fault Tetrahedra in X- ray Topographs of Cubic Silicon Carbide", Phil. Mag. Letts., 83, 473-476, (2003). 203. X. Xu, R.P. Vaudo, G.R. Brandes, J. Bai, P.I. Gouma, and M. Dudley, "Chemical Mechanical Polishing for Decoration and Measurement of Dislocations on Free-Standing GaN Wafers", Phys. Stat. Sol. (c), 0 (7), 2460-2463, (2003). 204. L.J. Schowalter, G.A. Slack, J.B. Whitlock, K. Morgan, S.B. Schujman, B. Raghothamachar, M. Dudley, and K.R. Evans, " Fabrication of Native, Single- Crystal AlN Substrates", Phys. Stat. Sol. (c), 0 (7), 1997-2000, (2003). 205. R. Dalmau, B. Raghothamachar, M. Dudley, R. Schlesser, Z. Sitar, Mat. Res. Soc. Symp. Proc., 798 (GaN and Related Alloys--2003), 287-291 (2003). 206. W.M. Vetter and M. Dudley, "Characterization of defects in 3C-SiC Crystals", J. Cryst. Growth, 260, 201-208, (2004). 207. W.M. Vetter, R. Nagarajan, J.H. Edgar, and M. Dudley, "Double Positioning Twinning in Icosohedral B12As2 Thin Films Grown by Chemical Vapor Deposition", Materials Letts., 58, 1331-1335, (2004). 208. J. Bai, M. Dudley, B. Raghothamachar, P. Gouma, B.J. Skromme, L. Chen, P.J. Hartlieb, E. Michaels and J. Kolis, "Correlated Structural and Optical Characterization of Ammonothermally-Grown Bulk GaN", Appl. Phys. Letts., 84, 3289-3291, (2004). 209. W.M. Vetter and M. Dudley, "Micropipes and the Closure of Axial Screw Dislocation Cores in Silicon Carbide Single Crystals", J. Appl. Phys., 96, 348- 353, (2004). 210. W.M. Vetter and M. Dudley, "The Contrast of Inclusions Compared with that of Micropipes in Back-Reflection Synchrotron White Beam Topographs of SiC", J. Appl. Cryst., 37, 200-203, (2004). 211. W.D. Cho, X.-R. Huang, and M. Dudley, "Exact Formulation for Pi- Polarization Waves of Dynamical X-ray Diffraction", Acta Cryst., A60, 195-197, (2004). 212. X.-R. Huang, M. Dudley, W. Cho, R.S. Okojie, and P.G. Neudeck, "Characterization of SiC Epitaxial Structures using High-Resolution X-ray Diffraction Techniques" in Silicon Carbide and Related Materials 2003, R. Madar, J. Camassel, and E. Blanquet (Eds.), Materials Science Forum, 457-460, 157-162, Trans Tech Publications, Switzerland, (2004). 213. X. Ma, M. Dudley, T. Sudarshan, "Nondestructive Defect Characterization of SiC Epilayers and its Significance for SiC Device Research" in Silicon Carbide and Related Materials 2003, R. Madar, J. Camassel, and E. Blanquet (Eds.), Materials Science Forum, 457-460, 601-604, Trans Tech Publications, Switzerland, (2004). 214. J. Bai, G. Dhanaraj, P. Gouma, M. Dudley, and M. Mynbaeva, "Porous SiC for HT Chemical Sensing Devices: An Assessment of its Thermal Stability" in Silicon Carbide and Related Materials 2003, R. Madar, J. Camassel, and E. Blanquet (Eds.), Materials Science Forum, 457-460, 1479-1482, Trans Tech Publications, Switzerland, (2004). 215. G. Dhanaraj, M. Dudley, R.H. Ma, H. Zhang, and V. Prasad, "Design and Fabrication of Physical Vapor Transport System for the Growth of SiC Crystals", Review Sci. Instrum., 75, 2843-2847, (2004). 216. B. Liu, J.H. Edgar, Z. Gu, D. Zhuang, B. Raghothamachar, M. Dudley, A. Sarua, M. Kuball, H.M. Meyer, "The Durability of Various Crucible Materials for Aluminum Nitride Crystal growth by Sublimation", MRS Internet Journal of Nitride Semicond. Res., 9, Art. No. 6, (2004). 217. J. Bai, M. Dudley, L. Chen, B. J. Skromme, P. J. Hartlieb, E. Michaels, J. W. Kolis, B. Wagner, R. F. Davis, U. Chowdhury and R. D. Dupuis, "Relationship of basal plane and prismatic stacking faults in GaN to low temperature photoluminescence peaks at ~3.4eV and ~3.2eV", Mater. Res. Soc. Symp. Proc., 831, E11.37 (2005). 218. B. Raghothamachar, M. Dudley, B. Wang, M. Callahan, D. Bliss, P. Konkapaka, H. Wu, and M. Spencer, "X-ray Characterization of GaN Single Crystal Layers Grown by the Ammonothermal Technique on HVPE GaN Seeds and by the Sublimation Technique on Sapphire Seeds", Mater. Res. Soc. Symp. Proc., 831, E8.23, (2005). 219. B. Raghothamachar, M. Dudley, R. Dalmau, R. Schlesser, and Z. Sitar, "Synchrotron White Beam X-ray Topography (SWBXT) and High Resolution Triple Axis Diffraction Studies on AlN layers Grown on 4H- and 6H-SiC Seeds" , Mater. Res. Soc. Symp. Proc., 831, E8.24, (2005). 220. Y. Wang, G.N. Ali, M.K. Mikhov, V. Vaidyanathan, B.J. Skromme, B. Raghothamachar, and M. Dudley, "Correlation Between Morphological Defects, Electron Beam Induced Current Imaging, and the Electrical Properties of 4H-SiC Schottky Diodes, J. Appl. Phys., 97, 013540-1 ~V 013540-10, (2005). 221. B. Liu, J.H. Edgar, B. Raghothamachar, M. Dudley, A. Sarua, M. Kuball, H.M. Meyer, J.Y. Lin, H.X. Jiang, A. Sarua, and M. Kuball, "Free Nucleation of Aluminum Nitride Single Crystals in HPBN Crucible by Sublimation", Mater. Sci. & Engin. B, 117, 99-104, (2005). 222. J. Bai, M. Dudley, L. Chen, B. J. Skromme, B. Wagner, R. F. Davis, U. Chowdhury and R. D. Dupuis, "Structural defects and luminescence features in heteroepitaxial GaN grown on on-axis and misoriented substrates", J. Appl. Phys., 97, 116101, 2005 223. X. R. Huang, J. Bai, M. Dudley, R. D. Dupuis and U. Chowdhury "Epitaxial tilting of GaN grown on vicinal surfaces of sapphire", Appl. Phys. Letts, 86, 211916, (2005). 224. V. Noveski, R. Schlesser, B. Raghothamachar, M. Dudley, S. Mahajan, S. Beaudoin, and Z. Sitar, "Seeded Growth of Bulk AlN Crystals and Grain Evolution in Polycrystalline AlN Boules", J. Cryst. Growth, 279, 13-19, (2005). 225. W.M. Vetter, H. Tsuchida, I. Kamata, and M. Dudley, "Simulation of Threading Dislocation Images in X-ray Topographs of Silicon Carbide Homo- Epilayers", J. Appl. Cryst., 38, 442-447, (2005). 226. G. Dhanaraj, B. Raghothamachar, J. Bai, H. Chung and M. Dudley, "Synchrotron X-ray topographic characterization of defects in InP bulk crystals", Proceedings of the 17th Indium Phosphide and related materials conference, 8th ~V 12th May 2005, Glasgow, Scotland, UK (CD-Rom). 227. X.R. Huang, J. Bai, M. Dudley, B. Wagner, R.F. Davis, Y. Zhu, "Step- controlled strain relaxation in vicinal surface epitaxy of nitrides", Phys. Rev. Letts., 95, 086101-1 - 086101-4, (2005). 228. Jie Bai, X-Huang, M. Dudley, B. Wagner, R.F. Davis, L. Wu, and Y. Zhu, "Intersecting Basal Plane and Prismatic Stacking Fault Structures and their Formation Mechanisms in GaN", J. Appl. Phys., 98, 063510-1 - 063510-9, (2005). 229. M. D. Hollingsworth, M. L. Peterson, J. R. Rush, M. E. Brown, M. J. Abel, A. A. Black, M. Dudley, B. Raghothamachar, U. Werner-Zwanziger, E. J. Still, J. A. Vanecko, "Memory and Perfection in Ferroelastic Inclusion Compounds," Cryst. Growth Des., 5, 2100-2116 (2005). 230. G. Dhanaraj, M. Dudley, Y. Chen, B. Ragothamachar, B. Wu and H. Zhang, "Epitaxial Growth and Characterization of Silicon Carbide Films", J Cryst. Growth, accepted, (2005). 231. B. Raghothamachar, J. Bai, M. Dudley, R. Dalmau, D. Zhuang, Z. Herro, R. Schlesser, Z. Sitar, B. Wang, M. Callahan, D. Bliss, P. Konkapaka and M.Spencer, "Characterization of Bulk Grown GaN and AlN Single Crystal Materials", J Cryst. Growth, accepted, (2005). 232. B. Raghothamachar, G. Dhanaraj, J. Bai and M. Dudley, "Defect Analysis in Crystals using X-ray Topography," to appear in Microscopy Research and Technique, (2005) (Invited Paper). 233. M. Dudley, J. Bai, X. Huang, W.M. Vetter, G. Dhanaraj and B. Raghothamachar "Synchrotron White Beam X-ray Topography, Transmission Electron Microscopy and High Resolution X-ray Diffraction Studies of Defects and Strain Relaxation Processes in Wide Bandgap Semiconductor Crystals and Thin Films", to appear in Mater. Science in Semicon. Process., (2005). 234. J. Bai, X. Huang, M. Dudley "High resolution TEM observation of AlN grown on SiC and sapphire substrates", to appear in Mater. Science in Semicon. Process., (2005).
1. M. Dudley, J.N. Sherwood, D.J. Ando and D. Bloor, "X-ray Topographic Studies of the Solid State Polymerization of PTS (2,4-HexadiyneDiol Bis(p-Toluene Sulphonate-))", in "Extended Abstracts: 10th International Symposium on the Reactivity of Solids", University of Dijon - France, (1985),pp. 405-406.
2. M.Dudley, "Applications of Synchrotron Radiation Topography to Dynamic Processes in Single Crystal Materials", Bull. Amer. Phys. Soc., 31, 1265, (1986).
3. M. Dudley, "Synchrotron X-ray Topographic Studies of the Solid State Polymerization Process in the Diacetylene PTS", in "Abstracts for New Opportunities in Chemistry: An International Symposium on the Uses of Synchrotron Radiation in Chemistry", Brookhaven National Laboratory, BNL 52103, (1987), pp.111-112.
4. M. Dudley, "Determination of Penetration Depths and Analysis of Strains in Single Crystals by White Beam Synchrotron X-ray Topography in Grazing Bragg-Laue Geometries'', Bull. Amer. Phys. Soc., 33, 1702, (1988).
5. M. Dudley and J. Miltat, "Synchrotron X-ray Topographic Studies of the Influence of Elastic Stress on Magnetic Domain Configurations in Fe 3.5 wt % Si Single Crystals", Bull. Amer. Phys. Soc., 33, 1780, (1988).
6. G.-D. Yao and M. Dudley, "Synchrotron Radiation Topography Studies of the Phase Transition in LaGaO3 Single Crystals", Bull. Amer. Phys. Soc., 35, 1792, (1990).
7. G.-D. Yao, S.-Y. Hou and M. Dudley, "Application of White Beam Synchrotron Radiation Topography tothe Analysis of Twins", Bull. Amer. Phys. Soc., 35, 1792, (1990).
8. F. Liu, I. Baker, G.-D. Yao, and M. Dudley, "Synchrotron X-ray Topography of Polycrystalline Ice", in Proceedings of International Symposium on the Physics and Chemistry of Ice, Sapporo, Japan, 1991, p. 243-244, (1992).
1. M. Dudley, "Synchrotron X-ray Topographic Studies of the Strain Field Induced by an "Island" of Polymer Embedded in a Diacetylene Monomer Crystal", National Synchrotron Light Source Annual Report 1986, S. White-DePace and N. Gmur (Editors), BNL, Associated Universities Inc., (1986), p. 381.
2. M. Dudley, J. Wu and G.-D. Yao, "Analysis of X-ray Penetration Depths on White Beam Topographs Recorded in Grazing Bragg-Laue Geometries", National Synchrotron Light Source Annual Report 1987, S. White-DePace, N. Gmur and W. Thomlinson (Editors), BNL, Associated Universities Inc., (1987) p. 3-130.
3. M. Dudley, "Comparison of Neutron Topographs and Synchrotron X-ray Topographs Recorded from Organic Crystals'', National Synchrotron Light Source Annual Report 1988, S. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1988), p. 281.
4. M. Dudley, "White Beam Topographic Studies of the Long Range Influence of Reaction Induced Stress on Local Reaction Kinetics in the Single Crystal to Single Crystal Polymerization of PTS'', National Synchrotron Light Source Annual Report 1988, S. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1988), p. 282.
5. M. Dudley and B.M. Foxman, "White Beam Topographic Studies of the Perfection of Zn(H2O)4 (HC_CCOO)2 Single Crystals'', National Synchrotron Light Source Annual Report 1988, S. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1988), p. 283.
6. M. Dudley, J. Wu and G.-D. Yao, "White Beam Topographic Imaging in Grazing Bragg-Laue Geometries'' National Synchrotron Light Source Annual Report 1988, S. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1988), p. 284.
7. M. Dudley, D. Yuan and S. Trivedi, "Determination of the Size, Shape and Position of Crystallites in Low Absorption Contrast Composites by White Beam Micro-Topography'', National Synchrotron Light Source Annual Report 1988, S. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1988), p. 285.
8. M. Dudley and D. Yuan, "Determination of Dislocation Line Directions from Analysis of the Projected Directions of Their Images on White Beam Synchrotron Topographs'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 475.
9. M. Dudley, G.-D. Yao, J. Wu, H.-Y. Liu and Y.C. Kao, "Analysis of the Line Directions of Dislocations in Gallium Arsenide Epilayers on Silicon Using White Beam Synchrotron Radiation Topography'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 478.
10. M. Dudley and G.-D. Yao, "Characterization of High Tc Superconductor Epilayers on Lanthanum Gallate Substrates Using White Beam Synchrotron Topographic Imaging in Grazing Bragg-Laue Geometries'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 473.
11. M. Dudley, A.P. Jardine, G.-D. Yao and G. Tolis, "Analysis of Strain Fields Associated with Plasma Etched Gratings on Silicon Surfaces Using White Beam Synchrotron Radiation Topography in Grazing Bragg-Laue Geometries'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 474.
12. M. Dudley, G.-D. Yao, J. Wu, C.C. Lin, D. Gordon-Smith and C. Fazi, "X-ray Topographic Investigation of Electromagnetic Damage Induced in P-N Junctions on Silicon'', 1989 National Synchrotron Light Source Annual Report , S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 469.
13. M. Dudley, F.F.Y. Wang, and G. Tolis, "White Beam Synchrotron Topographic Studies of UV Induced Rapid Thermal Processing Damage in Silicon'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 476.
14. C.C. Lin, M. Dudley and J. Miltat, "Synchrotron Topographic Studies of the Effects of Elastic Stress on Magnetic Domain Configurations in Fe 3.5 wt % Si Single Crystals'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 470.
15. M. Dudley, S.Y. Hou and W. Jones, "White Beam Topographic Studies of p-Terphenyl Single Crystals'', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 472.
16. S.Y. Hou, M. Dudley and B.M. Foxman, "White Beam Synchrotron Topographic Studies of the Defect Structure of As-Grown Single Crystals of Zn(H2O)4(HC_CCOO)2 '', 1989 National Synchrotron Light Source Annual Report, S.L. Hulbert, N. Lazarz and G. Williams (Editors), BNL, Associated Universities Inc., (1990), p. 471.
17. S.Y. Hou, M. Dudley and W. Jones, ``X-ray Topographic Studies of Twinning in Terphenyl Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 302.
18. G.-D. Yao, M. Dudley and C.Y. Yang, "White Beam Topography of Natural Beryl Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 304.
19. S.Y. Hou, M. Dudley and B.M. Foxman, "Synchrotron X-ray Topographic Observation of Preferential Reactivity at Dislocations in Bis(Propiolato)TetraAquoZinc(II) Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 301.
20. J. Wu and M. Dudley, "Growth and Characterization of Magnesium Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 304.
21. G.-D. Yao, M. Dudley, Y. Wang, X. Liu and R.C. Liebermann, "Characterization and Analysis of Twinning in Lanthanum Gallate Single Crystals Using White Beam Synchrotron Topographic Imaging'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 305.
22. G.-D. Yao, M. Dudley, Y. Wang, X. Liu and R.C. Liebermann, "X-ray Topographic Studies of the Phase Transition Occurring at 145_ C in Lanthanum Gallate'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 306.
23. G.-D. Yao, J. Wu, M. Dudley, H.-Y. Liu and Y.C. Kao, "Determination of the Depth of Dislocations in Gallium Arsenide Epilayers on Silicon'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 306.
24. R.W. Green, G. Bryant, G. Ramseyer, T.H. Myers and M. Dudley, "White Beam Topographic Imaging of Defects in Indium Antimonide Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 300.
25. G. Tolis, M. Dudley, C. Fazi and D.Gordon-Smith, "X-ray Topographic Studies of the Distribution of Damage Accompanying the Electromagnetic Breakdown of PN Junctions on Silicon'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 302.
26. I. Baker, F.P. Liu, G.-D. Yao and M. Dudley, "Characterization of Defects in Ice Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 297.
27. G.-D. Yao, M. Dudley, D. Paine, D. Howard and R.N. Sacks, "Analysis of Defects in InXGa1-XAs Strained Layer Systems'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 305.
28. R. DiSalvo, M. Dudley and W. Jones, "X-ray Topographic Observation of the Interactions Between Dislocations and Twin Lamellae in Terphenyl Single Crystals'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 299.
29. T. Fanning, G. Tolis, F.F.Y. Wang, M. Dudley and D.T. Hodul, "X-ray Topographic Studies of the Influence of Rapid Thermal Processing (RTP) on Swirl Defects in Silicon'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 300.
30. T. Fanning, G. Tolis, F.F.Y. Wang, M. Dudley and D.T. Hodul, "X-ray Topographic Studies of Dislocation Motion in Silicon Caused by Rapid Thermal Processing (RTP)'', 1990 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 299.
31. J. Wu and M. Dudley, "Computer Aided Analysis of White Beam Synchrotron X-ray Topographs'', 1990 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1991), p. 303.
32. T. Fanning, M. Dudley, D. DiMarzio and L. Casagrande, "Characterization of Chemomechanically Polished CdTe and CdZnTe Single Crystal Wafers by Synchrotron X-ray White Beam Topography'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 237.
33. M. Dudley, J. Wu, and D. Gordon-Smith, "X-ray Topographic Studies of the Phase Transformation Occurring at -143_ C in p-terphenyl Single Crystals'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 237.
34. T. Fanning, M. Dudley, F.F.Y. Wang, D. Gordon-Smith, and D.T. Hodul, "Modification of Precipitate Strain Fields Accompanying RTP of High Carbon Content Silicon'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 238.
35. T. Fanning, M. Dudley, F.F.Y. Wang, D. Gordon-Smith, and D.T. Hodul, "Observation of Combined Climb and Glide Induced by RTP of High Carbon Content Silicon'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 238.
36. T. Fanning, M. Dudley, F.F.Y. Wang, D. Gordon-Smith and D.T. Hodul, "Observation of RTP Induced Dislocation Nucleation at Precipitates in High Carbon Content Silicon'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 239.
37. T. Fanning, M. Dudley, F.F.Y. Wang, D. Gordon-Smith and D.T. Hodul, "Studies of RTP Induced Damage in High Carbon Doped Silicon'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 239.
38. F. Liu, I. Baker, G.-D. Yao and M. Dudley, "Characterization of Defect Structures Close to Grain Boundaries in Ice Crystals'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 240.
39. F. Liu, I. Baker, G.-D. Yao and M. Dudley,"Observation of Faults Produced by Vacancy Condensation in Ice Single Crystals'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 240.
40. G. Tolis, M. Dudley, C. Fazi and D. Gordon-Smith, "Synchrotron Topographic Investigation of Damage Distributions Resulting from Electromagnetic Breakdown of Epitaxial Silicon p-n Junctions'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 241.
41. S. Wang, M. Dudley, D. Gordon-Smith, and C. Fazi, "Assessment of Damage Induced by Electromagnetic Breakdown on Silicon Bi-Polar Diodes by Synchrotron White Beam X-ray Topography'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 241.
42. S. Wang, M. Dudley, D. Gordon-Smith, and C. Fazi, "Grazing Bragg-Laue Synchrotron X-ray Topographic Imaging of Near-Surface Structural Damage in Silicon Bipolar Diodes After Failure with Microwave Pulses'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 242.
43. J. Wu and M. Dudley, "Characterization of Dislocation Structures Around Indents on Indium Antimonide Surfaces'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 242.
44. J. Wu, S.-P. Wang, and M. Dudley, "Characterization of Gel-Grown Single Crystals by Synchrotron White Beam Topography'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 243.
45. G.-D. Yao, S.-Y. Hou, M. Dudley and J.M. Phillips,"Analysis of Defect Structures in NdGaO3 Single Crystals'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 243.
46. G.-D. Yao, J. Wu, M. Dudley, V. Shastry, and P. Anderson, "Comparison Between Observation and Calculation of Surface Relaxation Effects on Dislocation Strain Fields in Thin Films'', 1991 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 244.
47. G.-D. Yao, S.-Y. Hou, M. Dudley and J.M. Phillips, "Analysis of Twin Structures in LaAlO3 Single Crystals'',1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 244.
48. G.-D. Yao, M. Dudley, T. Fanning, and D. Larson, "Imaging of Defect Structures in CdZnTe Single Crystals'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 245.
49. G.-D. Yao, S.-Y. Hou, M. Dudley, and J.M. Phillips, "Synchrotron Topography Observations of the Second Order Phase Transition in Lanthanum Aluminate Single Crystals'', 1991 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1992), p. 245.
50. G.D. Yao, W. Zhou, and M. Dudley, C.H. Su, M.P.Volz, D.C. Gillies, F.R. Szofran and S.L. Lehoczky, "Synchrotron Topography Observation of Twins In ZnTe Single Crystals'', 1992 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p. 339.
51. F. Liu, I. Baker, M. Dudley, and G.D. Yao, "Dynamic Observation of Dislocation Sources At Grain Boundaries in Ice'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.331.
52. W. Zhou, M. Dudley, C.H.Su, M.P. Volz, D.C. Gillies, F.R. Szofran and S. L. Lehoczky, "Characterization of Growth Defects in ZnTe Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.339.
53. S. Wang, M. Dudley, L.K. Cheng, and J.D. Bierlein, "Characterization of Hydrothermal Grown KTiOPO4 Single Crystals by Synchrotron X-Ray Topography'', 1992 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.334.
54. S. Wang, M. Dudley, L.K. Cheng, and J.D. Bierlein, "Imaging of Ferroelectric Domains in KTiOPO4 Single Crystals by Synchrotron X-Ray Topography'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.335.
55. S. Wang, M. Dudley, L.K. Cheng, and J.D. Bierlein, "Analysis of Planar Defects in KTiOPO4 (KTP) Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.334.
56. S. Wang, M. Dudley, L.K. Cheng, and J.D. Bierlein, "Synchrotron X-Ray Topographic Studies of Hydrothermal Grown KTiOAsO4 Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.335.
57. S. Wang, M. Dudley, C. Fazi, and D. Gordon-Smith, "Locating Filamentations Resulting From Electromagnetic Breakdown in Si-Bi-Polar Diodes'' 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.336.
58. S. Wang, M. Dudley, C. Carter, Jr., D. Asbury, C. Fazi, "Observation of Dislocation Sources in SiC Single Crystals Grown From Vapor Phase'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.333.
59. S. Wang, M. Dudley, C. Carter, Jr., D. Asbury, C. Fazi, "Observation of Open-Core Super Screw Dislocations in 6H-SiC Single Crystals Grown From Vapor Phase'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.333.
60. S. Wang, M. Dudley, C. Carter, Jr., D. Asbury, C. Fazi, "Analysis of Dislocations in SiC Wafers Imaged With Synchrotron White Beam X-Ray Topography'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.332.
61. S. Wang, M. Dudley, C. Carter, Jr., D. Asbury, C. Fazi, "Characterization of Defect Structures in SiC Single Crystals By Synchrotron X-Ray Topography'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.332.
62. T. Fanning, M. Dudley, M.B. Lee and L.G. Casagrande, "Comparison Between Rocking Curve Analysis and White Beam Topography As Characterization Tools For CdTc Buffer Layers Grown By MBE'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.329.
63. T. Fanning, M. Dudley, M.B. Lee and L.G. Casagrande, "Comparison Between Rocking Curve Analysis and White Beam Topography as Characterization Tools For CdTe Substrates For MBE Growth'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.329.
64. T. Fanning, M. Dudley, M.B. Lee and L.G. Casagrande, "Correlation Between Microstructures in CdTe Observed On White Beam Synchrotron Reflection Topographs and Etch pit Patterns'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.330.
65. T. Fanning, M. Dudley, M.B. Lee and L.G. Casagrande, "White Beam Synchrotron Transmission Topography of Dislocations in Ultrathin CdTe Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.330.
66. T. Fanning, M. Dudley, M.B. Lee and L.G. Casagrande, "White Beam Synchrotron Transmission Topography of Inclusions In Ultrathin CdTe Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.331.
67. J. Wu and M. Dudley, "Characterization of Defect Structures in Indium Antimonide Single Crystals Induced by Plastic Deformation'', 1992 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.336.
68. J. Wu, T. Fanning, M. Dudley, V. Shastry, and P. Anderson, "Influence of Surface Relaxation on X-Ray Topographic Images of Dislocations'', 1992 National Synchrotron Light Source Annual Report, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.338.
69. J. Wu, M. Dudley, and D. Larson, "Characterization of Microgravity Grown CdZnTe Single Crystals'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.338.
70. J. Wu and M. Dudley, "Investigation of Dislocation Structures Around Indentations On (001) Indium Antimonide Surfaces'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.337.
71. J. Wu and M. Dudley, "Investigation of Microdeformation of Indium Antimonide Single Crystals by Synchrotron White Radiation X-Ray Topography'', 1992 National Synchrotron Light Source Annual Report , S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1993), p.337.
72. M. Dudley, "X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), pp. 70-75.
73. H. Chung, S. Wang, M. Dudley, L. K. Cheng, J .D. Bierlein, and W. Bindloss, "Characterization of Growth Defects in KTA Single Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B160.
74. H. Chung, S. Wang, M. Dudley, L. K. Cheng, J .D. Bierlein, and W. Bindloss, "Investigation of Growth Defects in Flux Grown KTP Single Crystals By Synchrotron White Beam X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B160.
75. H. Chung, S. Wang, M. Dudley, L. K. Cheng, J .D. Bierlein, and W. Bindloss, "Observation of Interactions Between Dislocations and Growth Sector Boundaries and Growth Bands in KTA Using Synchrotron White Beam X-ray Topography'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B161.
76. H. Chung, S. Wang, M. Dudley, L. K. Cheng, J .D. Bierlein, and W. Bindloss, "Observation of (011) Ferroelectric Domain Walls in Flux Grown KTP Single Crystals by Synchrotron White Beam X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B161.
77. H. Chung, S. Wang, M. Dudley, L. K. Cheng, J .D. Bierlein, and W. Bindloss, ``Using Synchrotron White Beam X-ray Topography to Characterize Ferroelectric Domain Walls in KTP Single Crystals'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B162.
78. T. Fanning, M. Dudley, and M.B. Lee, "Synchrotron White Beam X-ray Topography Study of Dislocation Propagation from Inclusions in CdTe(111)B'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B162.
79. W. Huang, S. Wang, M. Dudley, and C. Fazi "Characterization of Super-Screw Dislocations in 6H-SiC Devices", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B163.
80. W. Huang, S. Wang, M. Dudley, and C. Fazi, "Observation of Defects in SiC Devices by Synchrotron White Beam X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B163.
81. W. Huang, S. Wang, M. Dudley, C. Fazi, R. Kaul, and J. H. McAdoo, "Investigation of Breakdown Damage in GaAs Devices by Synchrotron White Beam X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B164.
82. F. Liu, I. Baker, and M. Dudley, "Detailed Observation of the Mechanisms Involved in Temperature Change Induced Microstructural Changes in Polycrystalline Ice", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B164.
83. F. Liu, I. Baker, and M. Dudley, "Dislocation Analysis in Ice", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B165.
84. F. Liu, I. Baker, and M. Dudley, "Dislocation Recovery in Ice Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B165.
85. F. Liu, I. Baker, and M. Dudley, "Formation of Faulted Prismatic Dislocations Via Interstitial Condensation in Ice", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B166.
86. F. Liu, I. Baker, and M. Dudley, "Investigation of the Orientation Dependence of Stacking Fault Depleted Zones Near Grain Boundaries in Ice", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B166.
87. F. Liu, I. Baker, and M. Dudley, "Orientation Dependence of Slip in Ice Polycrystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B167.
88. W. Si, M. Dudley, T. McClelland, M. Bloch, R. Regis, B. Goldfrank, and S. Seifer, "Observation of Bonding Strain in SC Cut Quartz Resonators", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B167.
89. W. Si, M. Dudley, T. McClelland, M. Bloch, R. Regis, B. Goldfrank, and S. Seifer, "Observation of Electrode Strain in SC Cut Quartz Resonators", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B168.
90. W. Si, M. Dudley, T. McClelland, M. Bloch, R. Regis, B. Goldfrank, and S. Seifer, "Pendellosung Fringes in Transmission X-ray Topographs of SC Cut Quartz Resonators", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B168.
91. W. Si, M. Dudley, T. McClelland, M. Bloch, R. Regis, B. Goldfrank, and S. Seifer, "X-ray Reflection Topography Studies of Quartz Crystal Bars'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B169.
92. W.M. Vetter, M. Dudley, and B. Kahr, "X-ray Topographic Studies of Single Organic Hourglass Inclusion K2SO4 Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B169.
93. S. Wang, M. Dudley, and C. Carter, "Dislocation Generation Associated With Surface Relaxation in PVT 6H-SiC Single Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B170.
94. S. Wang, M. Dudley, and C. Carter, "Orientation Contrast of Open Core Screw Dislocations Revealed By Synchrotron White Beam X-ray Ray-Tracing Topographs", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B170.
95. S. Wang, M. Dudley, and C. Carter, "Scanning Mechanism for Synchrotron White Beam X-ray Topography", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B171.
96. S. Wang, M. Dudley, and C. Carter, "Study of Defects in 6H-SiC Epitaxial Thin Films on PVT 6H-SiC Substrates", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B171.
97. S. Wang, M. Dudley, and C. Carter, "Study of Polytypes in Commercial PVT 6H-SiC Single Crystal Using Synchrotron White Beam Topography'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B172.
98. S. Wang, M. Dudley, and C. Fazi, "Analysis of Defect Structures in Lely 6H-SiC Single Crystal Plates'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B172.
99. S. Wang, W. Huang, M. Dudley, N. Buchan, and D. Henshall, "Growth Defects in Longitudinal Cut PVT 6H-SiC Single Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B173.
100. S. Wang, J. Wu, H. Chung, and M. Dudley, "Computer Aided Analysis of Synchrotron White Beam X-ray Topographs By Adopting Spreadsheet Software", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B173.
101. W. Zhou, M. Dudley, C.H. Su, D.C. Gillies, F.R. Szofran, and S.L. Lehoczky, "Synchrotron White Beam Reflection Topography of Interfaces in Gallium-doped Germanium", in National Synchrotron Light Source Activity Report 1993, S.L. Hulbert and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B174.
102. W. Zhou, M. Dudley, C.H. Su, D.C. Gillies, F.R. Szofran, and S.L. Lehoczky, "Atomic Structures of Twin Boundaries in ZnTe Single Crystals'', in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B174.
103. W. Zhou, M. Dudley, C.H. Su, D.C. Gillies, F.R. Szofran, and S.L. Lehoczky, "Correlations Between Growth Defects and Growth Conditions in ZnTe Single Crystals", in National Synchrotron Light Source Activity Report 1993, E.Z. Rothman, S.L. Hulbert, and N.M. Lazarz (Editors), BNL, Associated Universities Inc., (1994), p. B175.
104. H. Chung and M. Dudley, "Imaging GaN Thin Films on (0001) Sapphire Substrates by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B122.
105. H. Chung, M. Dudley, D. Larson, Jr., D. DiMarzio, and L. Carr, "Imaging of Crystals Defects in Sapphire Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B123.
106. H. Chung, M. Dudley, D. Larson, Jr., D. DiMarzio, and L. Carr, "Characterization of Basal Plane Dislocation in Sapphire Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B123.
107. H. Chung, S. Wang, M. Dudley, L.K. Cheng, J.D. Bierlein, and W. Bindloss, "The Analysis of Displacement Vectors of 180_ Ferroelectric Domain Walls in KTP Single Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B124.
108. H. Chung, S. Wang, M. Dudley, L.K. Cheng, J.D. Bierlein, and W. Bindloss, "Studies of Elastic Strains Associated with 180_ Ferroelectric Domain Walls in KTP Single Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editors), BNL, Associated Universities Inc., (1995), p. B124.
109. H. Chung, J. Wu, M. Dudley, and D. Larson, Jr., "Characterization of Growth Defects in an Ultra-Thin CdZnTe Single Crystal by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B125.
110. H. Chung, M. Dudley, and D. Larson, Jr., "Imaging Large CdZnTe Single Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B125.
111. H. Chung, M. Dudley, and D. Larson, Jr., "Synchrotron White Beam X-ray Topographic Investigation of Microgravity Grown CdZnTe Single Crystals" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B126.
112. W. Huang, S. Wang, and M. Dudley, "Computer Aided Synchrotron White Beam Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B126.
113. W. Huang, S. Wang, M. Dudley, and C. Fazi, "Influence of Structural Defects on Electrical Properties of SiC Devices" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B127.
114. W. Huang, S. Wang, M. Dudley, C. Fazi, R. Kaul, J.H. McAdoo, "Assessment of Damage Accompanying the Electrical Breakdown of GaAs Devices" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B127.
115. W. Huang, S. Wang, M. Dudley, C. Fazi, R. Kaul, J.H. McAdoo, "Synchrotron White Beam Investigation of Depth Distribution of Electrical Damage in GaAs Devices" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B128.
116. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Characterization of Polytypes in SiC Devices by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B128.
117. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Depth Profiling Analysis of Polytypes and Stacking Faults in SiC Devices Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B129.
118. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Comparison of Defect Structures in PVT and Lely SiC Devices" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B129.
119. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Influence of Surface Morphology on SiC Epitaxial Growth Through CVD Technique" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B130.
120. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Observation of DPB's in SiC Devices by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B130.
121. W. Huang, S. Wang, M. Dudley, J.A. Powell, P. Neudeck, and C. Fazi, "Synchrotron White Beam Characterization of Defect Structures in Lely SiC Platelets" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B131.
122. M.P. Kelley, B. Kahr and M. Dudley, "X-ray Topographic Studies of K2SO4 Synchrotron White Beam Characterization of Defect Structures in Lely SiC Platelets" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B132.
123. F. Liu, I. Baker and M. Dudley, "Investigation of the Role of Grain Boundaries in the Plastic Deformation of Ice: I. Pre deformation Microstructure" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B132.
124. F. Liu, I. Baker and M. Dudley, "Investigation of the Role of Grain Boundaries in the Plastic Deformation of Ice: II. In Situ Straining" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B133.
125. F. Liu, I. Baker and M. Dudley, "Investigation of the Role of Grain Boundaries in the Plastic Deformation of Ice: III. In Situ Annealing" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B133.
126. S. Wang, M. Dudley, and C.H. Carter, Jr., "Analysis of Synchrotron Topographic Contrast from Superscrew Dislocations in PVT 6H-SiC Single Crystals" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B135.
127. W.M. Vetter and M. Dudley "X-ray Topography of Thin Films Prepared from Longitudinal-Cut 6H-SiC Wafers" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B135.
128. S. Wang, M. Dudley, and C.H. Carter, Jr., "Hollow Core Screw Dislocations in PVT 6H-SiC Single Crystals Revealed by Synchrotron Topography and SEM" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B136.
129. S. Wang, M. Dudley, and C.H. Carter, Jr., "Superscrew Dislocations in PVT 6H-SiC Single Crystals Revealed by Synchrotron Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B136.
130. S. Wang, M. Dudley, C.H. Carter, Jr., and V. Tsvetkov, "Characterization of Dislocation Structures in PVT 6H-SiC Crystal Wafers by Synchrotron White Beam Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B137.
131. S. Wang, M. Dudley, and C.H. Carter, Jr., "Synchrotron Back-Reflection Topography for Imaging Super-Screw Dislocations in PVT 6H-SiC Single Crystals" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B137.
132. S. Wang, M. Dudley, C. Fazi, R. Rupp, "Defect Structures in PVT 4H-SiC Single Crystals Revealed by Synchrotron Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B138.
133. S. Wang, M. Dudley, C. Fazi, R. Rupp, "Comparison of Super-Screw Dislocations in PVT 4H-SiC and 6H-SiC Single Crystals Revealed by Synchrotron Back-Reflection Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B138.
134. W. Zhou, H. Chung, M. Dudley, C.-H. Su, M.P. Volz, D.C. Gillies, F.R. Szofran, and S.L. Lehoczky, "Investigation of Structural Defects in ZnSe Single Crystals by Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1994, E.Z. Rothman (Editor), BNL, Associated Universities Inc., (1995), p. B139
135. H. Chung, M. Dudley, and J. Wu, "Synchrotron White Beam X-ray Topography Studies of Interfacial Dislocations in SiGe/Si Heterostructures" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
136. H. Chung, B. Raghothamachar, M. Dudley, M. Lichtensteiger, and D.C. Gillies, "Studies of Interface Demarcation and Structrural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
137. H. Chung, W. Si, M. Dudley, V. Prasad, A. Anselmo, and D. F. Bliss, "Investigation of Dislocation Distributions in InP single crystals Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
138. H. Chung, W. Si, M. Dudley, V. Prasad, A. Anselmo and D. F. Bliss, "Studies of Twinning in LEK Grown InP Single Crystals by Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
139. H. Chung, B. Raghothamachar, M. Dudley, and D.C. Gillies, "Characterization of Growth Defects in HgCdTe Single Crystals by Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
140. H. Chung, M. Dudley, and Sanghamitra Sen, "Characterization of Structural Defects in HgCdTe Epilayers by Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
141. H. Chung, B. Raghothamachar, M. Dudley, W. Palosz, and D.C. Gillies, "Synchrotron White Beam X-ray Topography Characterization of Twin Structures in Vapor Grown CdZnTe Single Crystals" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
142. H. Chung, B. Raghothamachar, M. Dudley, W. Palosz, and D.C. Gillies, " Studies of Defect Structures in PVT grown CdZnTe Single crystals Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
143. H. Chung, M. Dudley, M. E. Brown, and Mark D. Hollingsworth, "Synchrotron White Beam X-ray Topography Characterization of Structural Defects in 2,10-Undecanedione/Urea Inclusion Compounds" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
144. H. Chung, M. Dudley, M. E. Brown, and Mark D. Hollingsworth, "Studies of Twinning in 2,10-Undecanedione/Urea Inclusion Compounds Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
145. H. Chung, M. Dudley, M. E. Brown, and Mark D. Hollingsworth, "Characterization of structure defects in 2, 12-Undecanedione/Urea single crystals by Using Synchrotron White Beam X-ray Topography" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
146. W. M. Vetter and M. Dudley, "X-Ray Topography and Fluorescence Microscopy of a Basal Cut 6H-SiC Wafer" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
147. W. M. Vetter and M. Dudley, "X-Ray Topography and Laser Scanning Confocal Microscopy of a Longitudinal Cut 6H-SiC Wafer" in National Synchrotron Light Source Activity Report 1995, E. Z. Rothman (Editor), BNL, Associated University Inc., (1996)
148. B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson, Jr., "Studies on the influence of post solidification cooling rate on the crystalline perfection of CdZnTe single crystals by synchrotron white beam x-ray topography" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
149. B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson, Jr., "Surface topography studies of an as-grown boule of CdZnTe" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
150. B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson, Jr., "Synchrotron x-ray topographic studies on the causes and nature of twinning in CdZnTe crystals" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
151. B. Raghothamachar, H. Chung, M. Dudley, D.J. Larson, Jr., "Synchrotron x-ray topography studies on the formation of slip bands and subgrain boundaries in Bridgman grown CdZnTe single crystals" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
152. B. Raghothamachar, H. Chung, M. Dudley, B. Fitzpatrick, "Characterization of structural defects in ZnSe by synchrotron white beam x-ray topography" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
153. J. Su, M.Dudley, T. Mclelland, B. Goldfrank, "Studies of quartz crystal bars using synchrotron white beam X-ray topography" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
154. J. Su, M.Dudley, T. Mclelland, B. Goldfrank, "Comparison of quartz resonator bonding strain by synchrotron white beam topography" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
155. J. Su, H. Chung, M.Dudley, D. DiMarzio, W. Bonner, "Observation of growth defects in GaInSb single crystal by synchrotron white beam X-ray topography" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
156. J. Su, H. Chung, M.Dudley, D. DiMarzio, W. Bonner, "Synchrotron white beam X-ray topographic investigation of growth processing in GaInAs single crystal" in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996)
157. W. Si, H. Chung, M. Dudley, V. Prasad, A. Anselmo and D. F. Bliss, "Applications of absorption edge contour (AEC) mapping in Fe doped InP single crystal wafers", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
158. W. Si, H. Chung, M. Dudley, V. Prasad, A. Anselmo and D. F. Bliss, "Study of defect distributions in S doped InP single crystals by synchrotron x-ray reflection topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
159. W. Si, H. Chung, M. Dudley, V. Prasad, A. Anselmo and D. F. Bliss, "Investigation of defect structures in Sn doped InP single crystals using synchrotron x-ray transmission topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
160. W. Si, H. Chung, M. Dudley, V. Prasad, A. Anselmo and D. F. Bliss, "Study of effect of magnetic field on Fe precipitates in Fe-doped InP single crystals using synchrotron white beam x-ray topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
161. W. Si, S. Wang, M. Dudley, and C. H. Carter, Jr. "Determination of Burgers vectors of screw dislocations in 6H-SiC single crystals: I. Projection topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
162. W. Si, S. Wang, M. Dudley, and C. H. Carter, Jr. "Determination of Burgers vectors of screw dislocations in 6H-SiC single crystals: II. Section topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
163. W. Si, W. Huang, and M. Dudley, H. S. Kong, and C. H. Carter, Jr., "Observation of 3C-SiC inclusions in 4H-SiC epitaxial films grown on 4H-SiC single crystal substrates", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
164. W. Si, and M. Dudley, and C. H. Carter, Jr., "Examination of high quality 4H-SiC single crystal wafers by synchrotron white beam x-ray transmission topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
165. S. Wang, W. Huang, M. Dudley; M. Spencer; C. Fazi, "Synchrotron white beam x-ray topographic characterization of PVT 3C-SiC crystals", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
166. W. Huang, M. Dudley; J. Parsons; C. Fazi, "Observation of dislocation contrast reversal induced by strain field", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
167. W. Huang, M. Dudley; C. Fazi, "Characterization of defect structures in (111) 3C-SiC single crystals by synchrotron topography", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
168. W. Huang, M. Dudley, C. Fazi, "Measurement of residual stress in single crystals by synchrotron white beam divergence analysis", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
169. W. Huang, M. Dudley, C. Fazi, "Characterization of deformation in single crystals by synchrotron white beam absorption edge contour mapping", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996).
170. W. Huang, M. Dudley; C. Fazi, " Application of synchrotron white beam multiple diffraction line analysis in measurement of curvature of single crystals induced by lattice mismatch", in National Synchrotron Light Source Activity Report 1995, E.Z. Rothman (Editor), BNL, Associated University Inc. (1996). 171. Y. Chen, M. Dudley, D. R. Rhiger, "Synchrotron White Beam X-Ray Topography Investigation of Influence of Annealing on CdZnTe Substrate" in National Synchrotron Light Source Activity Report 1996, E. Z. Rothman (Editor), BNL, Associated Universities Inc., (1997), p. B163. 172. Y. Chen, W. Huang, W. Chen, M. Dudley, "Characterization of Processing Induced Defects in Silicon Device Using Synchrotron White Beam X-Ray Topography" in National Synchrotron Light Source Activity Report 1996, E. Z. Rothman (Editor), BNL, Associated Universities Inc., (1997), p. B164. 173. H. Chung, B. Raghothamachar, M. Dudley, D. J. Larson, Jr., "Investigations of Dislocation Distributions in Microgravity Grown CdZnTe Single Crystals Using Synchrotron White Beam X-Ray Topography" in National Synchrotron Light Source Activity Report 1996, E. Z. Rothman (Editor), BNL, Associated Universities Inc., (1997), p. B165. 174. H. Chung, B. Raghothamachar, M. Dudley, D. J. Larson, Jr., "Studies of Defect Structures in Microgravity Grown CdZnTe Single Crystals Using Synchrotron White Beam X-Ray Topography" in National Synchrotron Light Source Activity Report 1996, E. Z. Rothman (Editor), BNL, Associated Universities Inc., (1997), p. B165. 175. H. Chung, B. Raghothamachar, M. Dudley, D. J. Larson, Jr., "Studies of the Influence of Cooling Rate to Defect Microstructure Development in Microgravity Grown CdZnTe Single Crystals" in National Synchrotron Light Source Activity Report 1996, E. Z. Rothman (Editor), BNL, Associated Universities Inc., (1997), p. B166. < |